Moteur de recherche de fiches techniques de composants électroniques |
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LM2476 Fiches technique(PDF) 4 Page - National Semiconductor (TI) |
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LM2476 Fiches technique(HTML) 4 Page - National Semiconductor (TI) |
4 / 12 page LM2476 Test Circuits Figure 4 shows a typical test circuit to evaluate the LM2476 CRT Driver and Bias Clamp electrical characteristics. The driver test circuit is designed to allow for testing the transient response in a 50 Ω environment without the use of an expensive FET probe. An input from a 50 Ω pulse generator output can be AC coupled and biased with an external supply via the V BIAS input. The two 2.49 k Ω resistors form a 200:1 divider with the 50Ω resistor and the oscilloscope. The clamp test circuit is designed to allow for testing the clamp outputs. A clamp input can be biased with an external supply via the V DC input and a high impedance voltmeter (>100M Ω) can be used to measure the DC voltage at the clamp outputs. Test points can included to accommodate voltmeter or oscilloscope probes. 20121903 Note: 8 pF load includes parasitic capacitance. FIGURE 4. CRT Driver and Bias Clamp Test Circuits (One Channel) www.national.com 4 |
Numéro de pièce similaire - LM2476 |
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Description similaire - LM2476 |
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