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STK14CA8-RF35I Fiches technique(PDF) 5 Page - List of Unclassifed Manufacturers

No de pièce STK14CA8-RF35I
Description  128K x 8 AutoStoreTM nvSRAM QuantumTrapTM CMOS Nonvolatile Static RAM
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Fabricant  ETC [List of Unclassifed Manufacturers]
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STK14CA8-RF35I Fiches technique(HTML) 5 Page - List of Unclassifed Manufacturers

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STK14CA8
December 2004
Document Control #ML0022 rev 1.0
5
SRAM READ CYCLES #1 & #2
SYMBOLS
STK14CA8-25
STK14CA8-35
STK14CA8-45
NO.
#1
#2
Alt.
PARAMETER
MIN
MAX
MIN
MAX
MIN
MAX
UNITS
1
tELQV
tACS
Chip Enable Access Time
25
35
45
ns
2
tAVAV
c
tAVAV
c
tRC
Read Cycle Time
25
35
45
ns
3
tAVQV
d
tAA
Address Access Time
25
35
45
ns
4
tGLQV
tOE
Output Enable to Data Valid
12
15
20
ns
5
tAXQX
d
tOH
Output Hold after Address Change
3
3
3
ns
6
tELQX
tLZ
Chip Enable to Output Active
3
3
3
ns
7
tEHQZ
e
tHZ
Chip Disable to Output Inactive
10
13
15
ns
8
tGLQX
tOLZ
Output Enable to Output Active
0
0
0
ns
9
tGHQZ
e
tOHZ
Output Disable to Output Inactive
10
13
15
ns
10
tELICC
b
tPA
Chip Enable to Power Active
0
0
0
ns
11
tEHICC
b
tPS
Chip Disable to Power Standby
25
35
45
ns
Notes
c: W must be high during SRAM READ cycles
d: Device is continuously selected with E and G
both low
e: Measured
± 200mV from steady state output voltage
f: HSB must remain high during READ and WRITE cycles.
SRAM READ CYCLE #1:
Address Controlledc,d,f
SRAM READ CYCLE #2:
E Controlledc,f
DQ (DATA OUT)
ADDRESS
3
tAVQV
5
tAXQX
DATA VALID
2
tAVAV
2
tAVAV
DATA VALID
ADDRESS
DQ (DATA OUT)
ICC
STANDBY
ACTIVE
1
tELQV
6
tELQX
4
tGLQV
8
tGLQX
10
tELICCH
11
tEHICCL
7
tEHQZ
9
tGHQZ
E
G


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