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LM2406 Fiches technique(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No de pièce LM2406
Description  Monolithic Triple 9 ns CRT Driver
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Fabricant  NSC [National Semiconductor (TI)]
Site Internet  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM2406 Fiches technique(HTML) 2 Page - National Semiconductor (TI)

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Absolute Maximum Ratings (Notes 1 3)
Supply Voltage VCC
a
95V
Bias Voltage VBIAS
a
16V
Input Voltage VIN
b
05V to VBIAS a 05V
Storage Temperature Range TSTG
b
65 Cto a150 C
Lead Temperature (Soldering k10 sec)
300 C
ESD Tolerance
2 kV
Operating Range (Note 2)
VCC
a
60V to a85V
VBIAS
a
8V to a15V
VIN
a
1V to a7V
Case Temperature TCASE
b
20 Cto a100 C
Do not operate the part without a heat sink
Electrical Characteristics
Unless otherwise noted VCC ea80V VBIAS ea12V VIN ea33V CL e 8 pF Output e 40 VPP at 1 MHz TA e 25 C
Symbol
Parameter
Conditions
LM2406
Units
Min
Typical
Max
ICC
Supply Current (Per Channel)
No Output Load
18
30
mA
VOUT
Output Voltage
No Input Signal
45
50
55
VDC
tR
Rise Time
10% – 90% f e 1 MHz
9
nS
tF
Fall Time
90% – 10% f e 1 MHz
9
nS
AV
Voltage Gain
b
13
b
145
b
16
VV
LE
Linearity Error
(Note 4)
8
%
D
AV
Gain Matching
(Note 5)
10
dB
Note 1
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur
Note 2
Operating ratings indicate conditions for which the device is functional but do not guarantee specific performance limits For guaranteed specifications and
test conditions see the Electrical Characteristics The guaranteed specifications apply only for the test conditions listed Some performance characteristics may
change when the device is not operated under the listed test conditions
Note 3
All voltages are measured with respect to GND unless otherwise specified
Note 4
Linearity Error is defined as the variation in small signal gain from a30V to a70V output with a 100 mV AC 10 kHz input signal
Note 5
Calculated value from Voltage Gain test on each channel
Note 6
Input signal VIN tr tf k 2 nS
AC Test Circuit
TLH12327 – 3
Note
8 pF is total load including parasitic capacitance
FIGURE 2 Test Circuit (One Channel)
Figure 2 shows a typical test circuit for evaluation of the LM2406 This circuit is designed to allow testing of the LM2406 in a 50X
environment such as a pulse generator oscilloscope or network analyzer The two series resistors at the output form a 1001
voltage divider when connected to a 50X load
2


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