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LM136H Fiches technique(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
No de pièce LM136H
Description  2.5V REFERENCE DIODE, GUARANTEED TO 100K RADSi TESTED TO MIL-STD-883, METHOD 1019.5
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Fabricant  NSC [National Semiconductor (TI)]
Site Internet  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM136H Fiches technique(HTML) 4 Page - National Semiconductor (TI)

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MNLM136A-2.5-X-RH REV 0E0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
DC PARAMETERS: (SEE NOTE 3)
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC:
Iz = 1mA
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
Iadj
Adjust Current
Vadj = 0.7V
3
-125
+125
uA
1, 2,
3
Delta Z
Delta Zener
Voltage
400 uA < Z < 10mA
3
6
mV
1
3
10
mV
2, 3
Vz
Zener Voltage
Vadj = Open
3
2.465
2.515
V
1
3
2.44
2.54
V
2, 3
Vadj = 0.7V
3
2.39
2.49
V
1
3
2.29
2.49
V
2, 3
Vadj = 1.9V
3
2.49
2.69
V
1, 2,
3
Zrd
Reverse Dynamic
Impedance
1, 3
0.6
Ohm
1
1, 3
1
Ohm
2, 3
Vstab
Temp Stability
Vz = Adjusted to 2.490V
2, 3
18
mV
2, 3
DC PARAMETERS: DRIFT VALUES, (SEE NOTE 3)
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC:
"Delta Calculation Performed on QMLV devices at Group B, Subgroup 5 ONLY"
Vz
Zener Voltage
Vadj = Open
3
-10
10
mV
1
Vadj = 0.7V
3
-10
10
mV
1
Vadj = 1.9V
3
-10
10
mV
1
Note 1:
Parameter tested go-no-go only.
Note 2:
Tested on Auto Drift Oven.
Note 3:
Pre and post irradiation limits are identical to those listed under AC and DC
electrical characteristics. These parts may be dose rate sensitive in a space
environment and may demonstrate enhanced low dose rate effect. Radiation end point
limits for the noted parameters are guaranteed only for the conditions as spectified
in MIL-STD-883, Method 1019.5.
4


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