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A1356 Fiches technique(PDF) 12 Page - Allegro MicroSystems |
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A1356 Fiches technique(HTML) 12 Page - Allegro MicroSystems |
12 / 20 page High Precision Linear Hall-Effect Sensor IC With an Open Drain Pulse Width Modulated Output A1356 12 Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com Overview Programming is accomplished by sending a series of input volt- age pulses serially through the VCC pin of the device. A unique combination of different voltage level pulses controls the internal programming logic of the device to select a desired programma- ble parameter and change its value. There are three voltage levels that must be taken into account when programming. These levels are referred to as high, VP(HIGH), mid, VP(MID), and low, VP(LOW). The 1356 features Try mode, Blow mode and Lock mode: • In Try mode, the value of multiple programmable parameters may be set and measured simultaneously. The parameter values are stored temporarily, and reset after cycling the supply volt- age. • In Blow mode, the value of a single programmable parameter may be set and measured, and then permanently set by blowing solid-state fuses internal to the device. Additional parameters may be blown sequentially. This mode also is used for blow- ing the device-level fuse (when Lock mode is enabled), which permanently blocks the further programming of all parameters. • Lock mode prevents all future programming of the device. This is accomplished by blowing a special fuse using Blow mode. The programming sequence is designed to help prevent the device from being programmed accidentally; for example, as a result of noise on the supply line. Although any programmable variable power supply can be used to generate the pulse wave- forms, Allegro highly recommends using the Allegro Sensor Evaluation Kit, available on the Allegro website On-line Store. The manual for that kit is available for download free of charge, and provides additional information on programming these devices. Definition of Terms Register The section of the programming logic that controls the choice of programmable modes and parameters. Bit Field The internal fuses unique to each register, represented as a binary number. Changing the bit field settings of a particular register causes its programmable parameter to change, based on the internal programming logic. Key A series of mid-level voltage pulses used to select a register, with a value expressed as the decimal equivalent of the binary value. The LSB of a register is denoted as key 1, or bit 0. Code The number used to identify the combination of fuses activated in a bit field, expressed as the decimal equivalent of the binary value. The LSB of a bit field is denoted as code 1, or bit 0. Addressing Increasing the bit field code of a selected register by serially applying a pulse train through the VCC pin of the device. Each parameter can be measured during the addressing process, but the internal fuses must be blown before the program- ming code (and parameter value) becomes permanent. Fuse Blowing Applying a high voltage pulse of sufficient duration to permanently set an addressed bit by blowing a fuse internal to the device. After a bit (fuse) has been blown, it cannot be reset. Blow Pulse A high voltage pulse of sufficient duration to blow the addressed fuse. Cycling the Supply Powering-down, and then powering-up the supply voltage. Cycling the supply is used to clear the program- ming settings in Try mode. Programming Guidelines Programming Pulse Requirements, Protocol at TA = 25 °C Characteristic Symbol Notes Min. Typ. Max. Unit Programming Voltage VP(LOW) Measured at the VCC pin. – 5 5.5 V VP(MID) 13 15 16 V VP(HIGH) 26 27 28 V Programming Current IP Minimum supply current required to ensure proper fuse blowing. In addition, a minimum capacitance, CBLOW = 0.1 μF, must be connected between the supply and GND pins during programming to provide the current necessary for fuse blowing. The blowing capacitor should be removed and the load capacitance used for properly programming duty cycle measurements. 300 – – mA Pulse Width tLOW Duration of VP(LOW) for separating VP(MID) and VP(HIGH) pulses. 40 – – μs tACTIVE Duration of VP(MID) and VP(HIGH) pulses for register selection or bit field addressing. 40 – – μs tBLOW Duration of VP(HIGH) pulses for fuse blowing. 40 – – μs Pulse Rise Time tPr Rise time required for transitions from VP(LOW) to either VP(MID) or VP(HIGH). 5 – 100 μs Pulse Fall Time tPf Fall time required for transitions from VP(HIGH) to either VP(MID) or VP(LOW). 5 – 100 μs |
Numéro de pièce similaire - A1356_16 |
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Description similaire - A1356_16 |
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