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LF411JAN Fiches technique(PDF) 3 Page - Texas Instruments

No de pièce LF411JAN
Description  Low Offset, Low Drift JFET Input Operational Amplifier
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI1 - Texas Instruments

LF411JAN Fiches technique(HTML) 3 Page - Texas Instruments

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LF411JAN
www.ti.com
SNOSAQ4A – OCTOBER 2005 – REVISED MARCH 2013
Absolute Maximum Ratings
(1)
Supply Voltage
±18V
Differential Input Voltage
±30V
Input Voltage Range(2)
±15V
Output Short Circuit Duration
Continuous
Power Dissipation(3)(4)
400mW
TJmax
175°C
Still Air
162°C/W
θJA
Thermal Resistance
400LF/Min Air Flow
65°C/W
θJC
20°C/W
Operating Temperature Range
−55°C ≤ TA ≤ 125°C
Storage Temperature Range
−65°C ≤ TA ≤ 150°C
Lead Temperature (Soldering, 10 seconds)
300°C
Package Weight (Typical)
TBD
ESD Tolerance(5)
750V
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The specified specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
Unless otherwise specified the absolute maximum negative input voltage is equal to the negative power supply voltage.
(3)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.
(4)
Max. Power Dissipation is defined by the package characteristics. Operating the part near the Max. Power Dissipation may cause the
part to operate outside specified limits.
(5)
Human body model, 100pF discharged through 1.5K
Ω.
Quality Conformance Inspection
Table 1. Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp °C
1
Static tests at
25
2
Static tests at
125
3
Static tests at
-55
4
Dynamic tests at
25
5
Dynamic tests at
125
6
Dynamic tests at
-55
7
Functional tests at
25
8A
Functional tests at
125
8B
Functional tests at
-55
9
Switching tests at
25
10
Switching tests at
125
11
Switching tests at
-55
12
Settling time at
25
13
Settling time at
125
14
Settling time at
-55
Copyright © 2005–2013, Texas Instruments Incorporated
Submit Documentation Feedback
3
Product Folder Links: LF411JAN
Not Recommended For New Designs


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