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SN74HC21-Q1 Fiches technique(PDF) 1 Page - Texas Instruments

No de pièce SN74HC21-Q1
Description  DUAL 4-INPUT POSITIVE-AND GATE
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI1 - Texas Instruments

SN74HC21-Q1 Fiches technique(HTML) 1 Page - Texas Instruments

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SN74HC21-Q1
DUAL 4-INPUT POSITIVE-AND GATE
SCLS597A − NOVEMBER 2004 − REVISED APRIL 2008
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Qualified for Automotive Applications
D Wide Operating Voltage Range of 2 V to 6 V
D Outputs Can Drive up to Ten LSTTL Loads
D Low Power Consumption, 20-µA Max I
CC
D Typical t
pd = 11 ns
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 µA Max
description/ordering information
This
device
contains
two
independent
4-input
AND
gates.
It
performs
the
Boolean
function
Y
+ A • B • C • Dor Y + A ) B ) C ) D in positive logic.
ORDERING INFORMATION{
TA
PACKAGE
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
40
°C to 125°C
SOIC − D
Reel of 2500
SN74HC21QDRQ1
HC21Q
−40
°C to 125°C
TSSOP − PW
Reel of 2000
SN74HC21QPWRQ1
HC21Q
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI web site at http://www.ti.com.
Package drawings, thermal data, and symbolization are available at http://www.ti.com/packaging.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
C
D
OUTPUT
Y
H
H
H
H
H
L
XX
X
L
X
LX
X
L
X
XL
X
L
X
X
X
L
L
logic diagram (positive logic)
1A
1Y
1B
1C
1D
2A
2Y
2B
2C
2D
1
2
4
5
9
10
12
13
68
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
NC
1C
1D
1Y
GND
VCC
2D
2C
NC
2B
2A
2Y
D OR PW PACKAGE
(TOP VIEW)
Copyright
 2008, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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