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ADC081S101 Fiches technique(PDF) 6 Page - Texas Instruments

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No de pièce ADC081S101
Description   Single Channel, 0.5 to 1 Msps, 8-Bit A/D Converter
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI1 - Texas Instruments

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IOL
200 2A
IOH
200 2A
1.6 V
To Output Pin
CL
25 pF
ADC081S101
SNAS310D – JANUARY 2006 – REVISED JANUARY 2014
www.ti.com
ADC081S101 Timing Specifications
The following specifications apply for VA = +2.7V to 5.25V, GND = 0V, fSCLK = 10.0 MHz to 20.0 MHz, CL = 25 pF, fSAMPLE =
500 ksps to 1 Msps, Boldface limits apply for TA = TMIN to TMAX: all other limits TA = 25°C.
Symbol
Parameter
Conditions
Typical
Limits
Units
tCS
Minimum CS Pulse Width
10
ns (min)
tSU
CS to SCLK Setup Time
10
ns (min)
tEN
Delay from CS Until SDATA TRI-STATE Disabled (1)
20
ns (max)
VA = +2.7 to +3.6
40
ns (max)
tACC
Data Access Time after SCLK Falling Edge (2)
VA = +4.75 to +5.25
20
ns (max)
tCL
SCLK Low Pulse Width
0.4 x tSCLK
ns (min)
tCH
SCLK High Pulse Width
0.4 x tSCLK
ns (min)
VA = +2.7 to +3.6
7
ns (min)
tH
SCLK to Data Valid Hold Time
VA = +4.75 to +5.25
5
ns (min)
25
ns (max)
VA = +2.7 to +3.6
6
ns (min)
tDIS
SCLK Falling Edge to SDATA High Impedance (3)
25
ns (max)
VA = +4.75 to +5.25
5
ns (min)
tPOWER-
Power-Up Time from Full Power-Down
1
µs
UP
(1)
Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V.
(2)
Measured with the timing test circuit shown in Figure 2 and defined as the time taken by the output signal to cross 1.0V or 2.0V.
(3)
tDIS is derived from the time taken by the outputs to change by 0.5V with the timing test circuit shown in Figure 2. The measured number
is then adjusted to remove the effects of charging or discharging the output capacitance. This means that tDIS is the true bus relinquish
time, independent of the bus loading.
Timing Diagrams
Figure 2. Timing Test Circuit
6
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