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ML4632 Fiches technique(PDF) 3 Page - Micro Linear Corporation |
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ML4632 Fiches technique(HTML) 3 Page - Micro Linear Corporation |
3 / 8 page ML4632 3 ABSOLUTE MAXIMUM RATINGS Absolute maximum ratings are those values beyond which the device could be permanently damaged. Absolute maximum ratings are stress ratings only and functional device operation is not implied. VCC ............................................................................... –0.3V to 6V Input Pin Voltages ............................. –0.3V to VCC +0.3V LED Output Current ............................................. 120mA PEAK DC Output Current ..................................... 120mA Storage Temperature .............................. –65 °C to +150°C Lead Temperature (Soldering 10 sec.) ..................... 260 °C ELECTRICAL CHARACTERISTICS Over the recommended operating conditions of TA = 0°C to 70°C, VCC = 5V ±5%, unless otherwise specified. (Note 1) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS ICC Supply Current LED off 25 35 mA VREF VREF Voltage No Load 1.14 1.20 1.26 V VPTAT PTAT Voltage No Load, TA = 25°C 0.9 1.0 1.1 V TA = 85°C 1.08 1.2 1.32 V VOS Driver Offset VDRV = 1.2V, RTSET = 20 Ω 50 mV LED Current Accuracy VDRV = VREF, RTSET = 20 Ω ILEDH High IOFF = open 54 60 66 mA ILEDL Low 0.5 0.7 1.0 mA tR Rise Time VDRV = VREF, RTSET = 20 Ω 4.5 ns tF Fall Time VDRV = VREF, RTSET = 20 Ω 4.5 ns Propagation Delay VDRV = VREF, RTSET = 20 Ω tPLH Low to High TTL and ECL 10.0 ns tPHL High to Low 10.0 ns tPWD Pulse Width Distortion VDRV = VREF, RTSET = 20 Ω 1.0 2.0 ns VPK Peaking Voltage RRPK = 20Ω, CPK = 100pF, RPEAK = 20Ω 1.08 1.2 1.32 V VPKTR Peaking Rise Time RRPK = 20Ω, CPK = 100pF, RPEAK = 20Ω 4.5 ns VPKTF Peaking Fall Time RRPK = 20Ω, CPK = 100pF, RPEAK = 20Ω 4.5 ns IECL ECL Input Current 20 µA ITTL TTL Input Current 100 µA VDO Dropout Voltage between pin 5 and 3 1.5 V IOFF Additional LED Off Current VCC = 5V, RIOFF = 4.3KΩ 0.8 1.0 1.2 mA VBIAS ECL BIAS Voltage VCC = 5V, TA = 25°C 3.8 V Note 1: Limits are guaranteed by 100% testing, sampling or correlation with worst-case test conditions. Note 2: Low Duty cycle pulse testing is performed at TA. |
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