7-354

Specifications CD4018BMS

Output Current (Source)

IOH5A

± 20% x Pre-Test Reading

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Pre Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

Interim Test 1 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

Interim Test 2 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Interim Test 3 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

Group A

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

4 - 6, 11, 13

1 - 3, 7 - 9, 10, 12,

14, 15

16

Static Burn-In 2

Note 1

4 - 6, 11, 13

8

1 - 3, 7, 9, 10, 12,

14 - 16

Dynamic Burn-

In Note 1

-

2, 8, 9, 15

1, 3, 12, 16

4 - 6, 11, 13

7, 14

10

Irradiation

Note 2

4 - 6, 11, 13

8

1 - 3, 7, 9, 10, 12,

14 - 16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

± 0.5V

PARAMETER

SYMBOL

DELTA LIMIT