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CAT28C16AK-20T Fiches technique(PDF) 4 Page - Catalyst Semiconductor |
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CAT28C16AK-20T Fiches technique(HTML) 4 Page - Catalyst Semiconductor |
4 / 8 page CAT28C16A 4 Doc. No. 25033-00 2/98 Figure 1. A.C. Testing Input/Output Waveform(3) 5089 FHD F03 Figure 2. A.C. Testing Load Circuit (example) 5089 FHD F04 Note: (1) This parameter is tested initially and after a design or process change that affects the parameter. (2) Output floating (High-Z) is defined as the state when the external data line is no longer driven by the output buffer. (3) Input rise and fall times (10% and 90%) < 10 ns. INPUT PULSE LEVELS REFERENCE POINTS 2.0 V 0.8 V 2.4 V 0.45 V 1.3V DEVICE UNDER TEST 1N914 3.3K CL = 100 pF OUT CL INCLUDES JIG CAPACITANCE A.C. CHARACTERISTICS, Read Cycle VCC = 5V ±10%, unless otherwise specified. 28C16A-20 Symbol Parameter Min. Max. Units tRC Read Cycle Time 200 ns tCE CE Access Time 200 ns tAA Address Access Time 200 ns tOE OE Access Time 80 ns tLZ(1) CE Low to Active Output 0 ns tOLZ(1) OE Low to Active Output 0 ns tHZ(1)(2) CE High to High-Z Output 55 ns tOHZ(1)(2) OE High to High-Z Output 55 ns tOH(1) Output Hold from Address Change 0 ns |
Numéro de pièce similaire - CAT28C16AK-20T |
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Description similaire - CAT28C16AK-20T |
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