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Moteur de recherche de fiches techniques de composants électroniques |
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Moteur de recherche de fiches techniques de composants électroniques |
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FQA19N60 Fiches technique(PDF) 5 Page - Fairchild Semiconductor |
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FQA19N60 Fiches technique(HTML) 5 Page - Fairchild Semiconductor |
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5 / 8 page  ©2000 Fairchild Semiconductor International Rev. A, April 2000 Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50K 200nF 12V Same Type as DUT Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50K 200nF 12V Same Type as DUT VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V VDS RL DUT RG VGS VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V VDS RL DUT RG VGS EAS =L IAS 2 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L I D t p EAS =L IAS 2 ---- 2 1 EAS =L IAS 2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L L I D I D t p |
Numéro de pièce similaire - FQA19N60 |
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Description similaire - FQA19N60 |
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