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SST38VF6404B-70-5I-CD Fiches technique(PDF) 25 Page - Microchip Technology |
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SST38VF6404B-70-5I-CD Fiches technique(HTML) 25 Page - Microchip Technology |
25 / 58 page 2013 Microchip Technology Inc. Preliminary DS25002B-page 25 SST38VF6401B / SST38VF6402B / SST38VF6403B / SST38VF6404B 5.2 DC Characteristics TABLE 5-11: DC OPERATING CHARACTERISTICS VDD = 2.7-3.6V 1 1. Typical conditions for the Active Current shown on the front page of the data sheet are average values at 25°C (room temperature), and VDD = 3V. Not 100% tested. Symbol Parameter Limits Test Conditions Min Max Units IDD Power Supply Current Address input=VILT/VIHT 2, V DD=VDD Max 2. See Figure 6-22 Read3 3. The IDD current listed is typically less than 2mA/MHz, with OE# at VIH. Typical VDD is 3V. 30 mA CE#=VIL, OE#=WE#=VIH at f= 5 MHz Intra-Page Read @5 MHz 2.5 mA CE#=VIL, OE#=WE#=VIH Intra-Page Read @40 MHz 20 mA CE#=VIL, OE#=WE#=VIH Program and Erase 35 mA CE#=WE#=VIL, OE#=VIH Program-Write-Buffer- to-Flash 50 mA CE#=WE#=VIL, OE#=VIH ISB Standby VDD Current 40 µA CE#=VIHC, VDD=VDD Max IALP Auto Low Power 40 µA CE#=VILC, VDD=VDD Max All inputs=VSS or VDD, WE#=VIHC ILI Input Leakage Current 1 µA VIN=GND to VDD, VDD=VDD Max ILIW Input Leakage Current on WP# pin and RST# 10 µA WP#=GND to VDD or RST#=GND to VDD ILO Output Leakage Current 10 µA VOUT=GND to VDD, VDD=VDD Max VIL Input Low Voltage 0.8 V VDD=VDD Min VILC Input Low Voltage (CMOS) 0.3 V VDD=VDD Max VIH Input High Voltage 0.7VDD VVDD=VDD Max VIHC Input High Voltage (CMOS) VDD-0.3 V VDD=VDD Max VOL Output Low Voltage 0.2 V IOL=100 µA, VDD=VDD Min VOH Output High Voltage VDD-0.2 V IOH=-100 µA, VDD=VDD Min TABLE 5-12: CAPACITANCE (TA = 25°C, F=1 MHZ, OTHER PINS OPEN) Parameter Description Test Condition Maximum CI/O 1 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. I/O Pin Capacitance VI/O = 0V 12 pF CIN 1 Input Capacitance VIN = 0V 6 pF TABLE 5-13: RELIABILITY CHARACTERISTICS Symbol Parameter Minimum Specification Units Test Method NEND 1,2 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. 2. NEND endurance rating is qualified as 100,000 cycles minimum per block. Endurance 100,000 Cycles JEDEC Standard A117 TDR 1 Data Retention 100 Years JEDEC Standard A103 ILTH 1 Latch Up 100 + IDD mA JEDEC Standard 78 |
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