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74F899 Fiches technique(PDF) 4 Page - Fairchild Semiconductor |
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74F899 Fiches technique(HTML) 4 Page - Fairchild Semiconductor |
4 / 12 page www.fairchildsemi.com 4 Absolute Maximum Ratings(Note 2) Recommended Operating Conditions Note 2: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 3: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 3) −0.5V to +7.0V Input Current (Note 3) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to V CC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) Twice the Rated IOL (mA) ESD Last Passing Voltage (Min) 4000V Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA VOH Output HIGH 10% VCC 2.5 IOH = −1 mA Voltage 10% VCC 2.4 IOH = −3 mA 10% VCC 2.0 V IOH = −15 mA (Bn, BPAR) 5% VCC 2.7 IOH = −1 mA 5% VCC 2.7 IOH = −3 mA VOL Output LOW 10% VCC 0.5 IOL = 20 mA Voltage (An, APAR, ERRA, ERRB) 5% VCC 0.55 V IOL = 24 mA (An, APAR, ERRA, ERRB) 10% VCC 0.55 IOL = 64 mA (Bn, BPAR) VTH Input Threshold Voltage 1.45 V ±0.1V, Sweep Edge Rate must be > 1V/50 ns VOLV Negative Ground Bounce 1.0 V Observed on “quiet” output during Voltage simultaneous switching of remaining outputs VOLP Positive Ground Bounce 1.0 V Observed on “quiet” output during Voltage simultaneous switching of remaining outputs IIL Input Low Current −0.6 mA Max VIN = 0.5V IIH Input HIGH 5.0 µAMax VIN = 2.7V Current IBVI Input HIGH Current 7.0 µAMax VIN = 7.0V Breakdown Test (ODD/EVEN, GBA, GAB, SEL, LEA, LEB) IBVIT Input HIGH Current 0.5 mA Max VIN = 5.5V Breakdown (I/O) (An, Bn, APAR, BPAR) ICEX Output HIGH 50 µAMax VOUT = VCC Leakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All Other Pins Grounded IOD Output Leakage 3.75 µA0.0 VIOD = 150 mV Circuit Current All Other Pins Grounded IIL Input Low Current −0.6 mA Max VIN = 0.5V IIH+ Output Leakage Current 70 µAMax VI/O = 2.7V IOZH Current (An, Bn, APAR, BPAR) |
Numéro de pièce similaire - 74F899 |
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Description similaire - 74F899 |
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