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74ABT16543 Fiches technique(PDF) 3 Page - Fairchild Semiconductor |
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74ABT16543 Fiches technique(HTML) 3 Page - Fairchild Semiconductor |
3 / 7 page 3 www.fairchildsemi.com Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Note 3: Guaranteed but not tested. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Any Output in the Disable or Power-Off State −0.5V to +5.5V in the HIGH State −0.5V to V CC Current Applied to Output in LOW State (Max) twice the rated IOL (mA) DC Latchup Source Current −500 mA Over Voltage Latchup (I/O) 10V Free Air Ambient Temperature −40°C to +85°C Supply Voltage +4.5V to +5.5V Minimum Input Edge Rate ( ∆V/∆t) Data Input 50 mV/ns Enable Input 20 mV/ns Clock Input 100 mV/ns Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized HIGH Signal VIL Input LOW Voltage 0.8 V Recognized LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA (Non I/O Pins) VOH Output HIGH Voltage 2.5 IOH = −3 mA, (An, Bn) 2.0 IOH = −32 mA, (An, Bn) VOL Output LOW Voltage 0.55 V Min IOL = 64 mA, (An, Bn) VID Input Leakage Test 4.75 V 0.0 IID = 1.9 µA, (Non-I/O Pins) All Other Pins Grounded IIH Input HIGH Current 1 µAMax VIN = 2.7V (Non-I/O Pins) ((Note 3) 1VIN = VCC (Non-I/O Pins) IBVI Input HIGH Current Breakdown Test 7 µAMax VIN = 7.0V (Non-I/O Pins) IBVIT Input HIGH Current 100 µAMax VIN = 5.5V (An, Bn) Breakdown Test (I/O) IIL Input LOW Current −1 µAMax VIN = 0.5V (Non-I/O Pins) (Note 3) −1V IN = 0.0V (Non-I/O Pins) IIH + IOZH Output Leakage Current 10 µA 0V–5.5V VOUT = 2.7V (An, Bn); OEAB or CEAB = 2V IIL + IOZL Output Leakage Current −10 µA 0V–5.5V VOUT = 0.5V (An, Bn); OEAB or CEAB = 2V IOS Output Short-Circuit Current −100 −275 mA Max VOUT = 0V (An, Bn) ICEX Output HIGH Leakage Current 50 µAMax VOUT = VCC (An, Bn) IZZ Bus Drainage Test 100 µA0.0V VOUT = 5.5V (An, Bn); All Others GND ICCH Power Supply Current 1.0 mA Max All Outputs HIGH ICCL Power Supply Current 60 mA Max All Outputs LOW ICCZ Power Supply Current 1.0 mA Max Outputs 3-STATE All Others at VCC or GND ICCT Additional ICC/Input 2.5 mA Max VI = VCC − 2.1V All Others at VCC or GND ICCD Dynamic ICC No Load Outputs Open, CEAB, OEAB, LEAB = GND, (Note 3) 0.25 mA/MHz Max CEBA = V CC, One Bit Toggling, 50% Duty Cycle |
Numéro de pièce similaire - 74ABT16543 |
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Description similaire - 74ABT16543 |
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