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LM317MSTT3G Fiches technique(PDF) 5 Page - ON Semiconductor |
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LM317MSTT3G Fiches technique(HTML) 5 Page - ON Semiconductor |
5 / 14 page LM317M, NCV317MAB, NCV317MB http://onsemi.com 5 *Pulse Testing Required: 1% Duty Cycle is suggested. Load Regulation (mV) = VO (min Load) -VO (max Load) Load Regulation (% VO) = VO (min Load) - VO (max Load) X 100 VO (min Load) VO (max Load) LM317M Cin 0.1 mF Adjust R2 1% CO 1.0 mF + * RL (max Load) RL (min Load) Vout R1 240 1% Vin Vin IAdj IL Figure 4. Load Regulation and DIAdj/Load Test Circuit VO (min Load) *Pulse Testing Required: 1% Duty Cycle is suggested. LM317M Vin Vout Adjust R1 240 1% + 1 mF CO RL Cin R2 1% To Calculate R2: Vout = ISET R2 + 1.250 V Assume ISET = 5.25 mA IL IAdj ISET Vref VO VI 0.1 mF Figure 5. Standard Test Circuit LM317M Vin Vout Vout = 10 V RL Cin 0.1 mF Adjust R1 240 1% D1 * 1N4002 CO + 1.0 mF 24V 14V R2 1.65K 1% CAdj 10 mF + *D1 Discharges CAdj if Output is Shorted to Ground. **CAdj provides an AC ground to the adjust pin. f = 120 Hz VO ** Figure 6. Ripple Rejection Test Circuit |
Numéro de pièce similaire - LM317MSTT3G |
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Description similaire - LM317MSTT3G |
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