ABSOLUTE MAXIMUM RATINGS

(1)

TPS3808-EP

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

NOMINAL SUPPLY

TOP-SIDE MARKING

TPS3808G01MDBVTEP

Adjustable

0.405 V

NXS

0.9 V

0.84 V

PREVIEW

1.2 V

1.12 V

PREVIEW

1.25 V

1.16 V

PREVIEW

1.5 V

1.40 V

PREVIEW

1.8 V

1.67 V

PREVIEW

2.5 V

2.33 V

PREVIEW

3.0 V

2.79 V

PREVIEW

TPS3808G33MDBVREP

3.3 V

3.07 V

CHK

5.0 V

4.65 V

PREVIEW

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com. Devices are shipped on tape and reel with either 250 units per reel (part numbers ending with 'TEP') or 3000

units per reel (part numbers ending with 'REP').

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

(3)

Custom threshold voltages from 0.82 V to 3.3 V, 4.4 V to 5.0 V are available through the use of factory EEPROM programming.

Minimum order quantities apply. Contact factory for details and availability.

(4)

Product Preview. Contact your TI sales representative for availability.

Over operating junction temperature range, unless otherwise noted.

TPS3808

UNIT

–0.3 to 7.0

V

V

–0.3 to 7

V

RESET pin current

5

mA

(2)

–55 to +150

°C

–65 to +150

°C

ESD rating, HBM

2

kV

ESD rating, CDM

500

V

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under the Electrical Characteristics

is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.

(2)

2

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