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DAC3162IRGZT Fiches technique(PDF) 1 Page - Texas Instruments

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No de pièce DAC3162IRGZT
Description  Dual-Channel, 10-/12-Bit, 500-MSPS Digital-to-Analog Converters (DACs)
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Fabricant  TI1 [Texas Instruments]
Site Internet  http://www.ti.com
Logo TI1 - Texas Instruments

DAC3162IRGZT Fiches technique(HTML) 1 Page - Texas Instruments

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1.2-V
Reference
DACA
DACB
Clock Distribution
BIASJ
IOUTAP
IOUTAN
IOUTBP
IOUTBN
DACCLKP
DACCLKN
D11P
D11N
D0P
D0N
AVDD33
LVPECL
LVDS
LVDS
VREF
12/10
12/10
DAC3152
DAC3162
www.ti.com
SLAS736D – NOVEMBER 2010 – REVISED AUGUST 2012
Dual-Channel, 10-/12-Bit, 500-MSPS Digital-to-Analog Converters (DACs)
Check for Samples: DAC3152, DAC3162
1
FEATURES
DESCRIPTION
The DAC3152/DAC3162 is a low-power, low-latency,
Low Power: 270 mW at 500 MSPS
high-dynamic-range, dual-channel, 10-/12-bit, pin-
LVDS Input Data Bus
compatible
family
of
digital-to-analog
converters
Interleaved DDR Data Load
(DACs) with a sample rate as high as 500 MSPS.
High DC Accuracy: ±0.25 LSB DNL (10-bit),
The device simplicity (no software required), low
± 0.5 LSB INL (12-bit)
latency, and low power simplify the design of complex
systems. The DACs interface seamlessly with the
Low Latency: 1.5 Clock Cycles
high-performance
TRF370333
analog
quadrature
Simple Control: No Software Required
modulator for direct upconversion architectures.
Differential Scalable Output: 2 mA to 20 mA
Digital data for both DAC channels is interleaved
On-Chip 1.2-V Reference
through a single LVDS data bus with on-chip
1.8-V and 3.3-V DC Supplies
termination. The high input rate of the devices allows
the processing of wide-bandwidth signals.
Space Saving Package: 48-pin 7-mm × 7-mm
QFN
The devices are characterized for operation over the
entire industrial temperature range of –40°C to 85°C
APPLICATIONS
and are available in a small 48-pin 7-mm × 7-mm
QFN package.
Cellular Base Stations
Wideband Communications
The low power, small size, speed, superior crosstalk,
simplicity, and low latency of the DAC3152/DAC3162
Medical Instrumentation
make
them
an
attractive
fit
for
a
variety
of
Test and Measurement
applications.
FUNCTIONAL BLOCK DIAGRAM
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2010–2012, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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