2 kW

V

+

DD

V

-/GND

DD

20 W

20 W

+

-

10 kW

100 W

+

-

V

-/GND

DD

+

-

+

-

TLC2201-SP

www.ti.com

SLOS710

– FEBRUARY 2011

PARAMETER MEASUREMENT INFORMATION

Figure 1. Noise-Voltage Test Circuit

Figure 2. Phase-Margin Test Circuit

Figure 3. Slew-Rate Test Circuit

Figure 4. Input-Bias and Offset-Current Test Circuit

TYPICAL VALUES

Typical values presented in this data sheet represent the median (50% point) of device parametric performance.

INPUT BIAS AND OFFSET CURRENT

At the picoamp bias current level of the TLC2201 accurate measurement of the bias current becomes difficult.

Not only does this measurement require a picoammeter, but test socket leakages can easily exceed the actual

device bias currents. To measure these small currents, Texas Instruments uses a two-step process. The socket

leakage is measured using picoammeters with bias voltages applied but with no device in the socket. The device

is then inserted in the socket, and a second test measuring both the socket leakage and the device input bias

current is performed. The two measurements are then subtracted algebraically to determine the bias current of

the device.

NOISE

Texas Instruments offers automated production noise testing to meet individual application requirements. Noise

voltage at f = 10 Hz and f = 1 kHz is sample tested on every TLC2201. For other noise requirements, please

contact the factory.

© 2011, Texas Instruments Incorporated

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Product Folder Link(s): TLC2201-SP