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TLC3702-Q1 Fiches technique(PDF) 9 Page - Texas Instruments |
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TLC3702-Q1 Fiches technique(HTML) 9 Page - Texas Instruments |
9 / 28 page TLC3702-Q1 www.ti.com SGLS156E – MARCH 2003 – REVISED AUGUST 2012 PARAMETER MEASUREMENT INFORMATION (continued) Figure 6. Circuit for Input Offset Voltage Measurement Response time is defined as the interval between the application of an input step function and the instant when the output reaches 50% of its maximum value. Response time for the low-to-high-level output is measured from the leading edge of the input pulse, while response time for the high-to-low-level output is measured from the trailing edge of the input pulse. Response time measurement at low input signal levels can be greatly affected by the input offset voltage. The offset voltage should be balanced by the adjustment at the inverting input as shown in Figure 7, so that the circuit is just at the transition point. A low signal, for example 105-mV or 5-mV overdrive, causes the output to change state Copyright © 2003–2012, Texas Instruments Incorporated Submit Documentation Feedback 9 Product Folder Link(s) :TLC3702-Q1 |
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