74AUP2G08GM datasheet(10/21 Pages) PHILIPS

No de pièce	74AUP2G08GM

Description	Low-power dual 2-input AND gate

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Fabricant	PHILIPS [NXP Semiconductors]

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74AUP2G08

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Product data sheet

Rev. 5 — 1 December 2011

10 of 21

NXP Semiconductors

74AUP2G08

Low-power dual 2-input AND gate

[1]

For measuring enable and disable times, RL = 5 k.

For measuring propagation delays, set-up and hold times and pulse width, RL =1M.

Test data is given in Table 10.

Definitions for test circuit:

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.

VEXT = External voltage for measuring switching times.

Fig 9.

Test circuit for measuring switching times

001aac521

DUT

RT

VI

VO

VEXT

VCC

RL

5 k

Ω

CL

G

Table 10.

Test data

Supply voltage

Load

VEXT

VCC

CL

RL[1]

tPLH, tPHL

tPZH, tPHZ

tPZL, tPLZ

0.8 V to 3.6 V

5 pF, 10 pF, 15 pF and 30 pF

5 k

 or 1 M

open

GND

2

 V

CC

Numéro de pièce similaire - 74AUP2G08GM

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NXP Semiconductors	74AUP2G08GM	100Kb / 17P	Low-power dual 2-input AND gate Rev. 03-29 May 2008
Nexperia B.V. All right...	74AUP2G08GM	292Kb / 19P	Low-power dual 2-input AND gate Rev. 11 - 17 June 2022

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Description similaire - 74AUP2G08GM

Fabricant	No de pièce	Fiches technique	Description
Nexperia B.V. All right...	74AUP2G08	292Kb / 19P	Low-power dual 2-input AND gate Rev. 11 - 17 June 2022
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Nexperia B.V. All right...	74AUP1G08-Q100	229Kb / 14P	Low-power 2-input AND gate
NXP Semiconductors	74AUP1G08	84Kb / 17P	Low-power 2-input AND gate Rev. 02-29 June 2006
Nexperia B.V. All right...	74AUP1G08	273Kb / 18P	Low-power 2-input AND gate Rev. 10 - 13 January 2022
Toshiba Semiconductor	TC7W08F	204Kb / 7P	DUAL 2-INPUT AND GATE
NXP Semiconductors	74HC2G08	85Kb / 16P	Dual 2-input AND gate 2002 Nov 15

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