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74AUP1G97 Fiches technique(PDF) 11 Page - NXP Semiconductors |
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74AUP1G97 Fiches technique(HTML) 11 Page - NXP Semiconductors |
11 / 22 page 74AUP1G97 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 6 — 10 January 2011 11 of 22 NXP Semiconductors 74AUP1G97 Low-power configurable multiple function gate [1] For measuring enable and disable times RL = 5 kΩ, for measuring propagation delays, setup and hold times and pulse width RL = 1 MΩ. 13. Transfer characteristics Test data is given in Table 11. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to the output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 13. Test circuit for measuring switching times 001aac521 DUT RT VI VO VEXT VCC RL 5 k Ω CL G Table 11. Test data Supply voltage Load VEXT VCC CL RL[1] tPLH, tPHL tPZH, tPHZ tPZL, tPLZ 0.8 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 k Ω or 1 MΩ open GND 2VCC Table 12. Transfer characteristics Voltages are referenced to GND (ground = 0 V; for test circuit see Figure 13. Symbol Parameter Conditions 25 °C −40 °C to +125 °C Unit Min Typ Max Min Max (85 °C) Max (125 °C) VT+ positive-going threshold voltage see Figure 14 and Figure 15 VCC = 0.8 V 0.30 - 0.60 0.30 0.60 0.62 V VCC = 1.1 V 0.53 - 0.90 0.53 0.90 0.92 V VCC = 1.4 V 0.74 - 1.11 0.74 1.11 1.13 V VCC = 1.65 V 0.91 - 1.29 0.91 1.29 1.31 V VCC = 2.3 V 1.37 - 1.77 1.37 1.77 1.80 V VCC = 3.0 V 1.88 - 2.29 1.88 2.29 2.32 V VT− negative-going threshold voltage see Figure 14 and Figure 15 VCC = 0.8 V 0.10 - 0.60 0.10 0.60 0.60 V VCC = 1.1 V 0.26 - 0.65 0.26 0.65 0.65 V VCC = 1.4 V 0.39 - 0.75 0.39 0.75 0.75 V VCC = 1.65 V 0.47 - 0.84 0.47 0.84 0.84 V VCC = 2.3 V 0.69 - 1.04 0.69 1.04 1.04 V VCC = 3.0 V 0.88 - 1.24 0.88 1.24 1.24 V |
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