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74AHC126D Fiches technique(PDF) 9 Page - NXP Semiconductors |
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74AHC126D Fiches technique(HTML) 9 Page - NXP Semiconductors |
9 / 15 page 74AHC_AHCT126_4 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 04 — 12 August 2009 9 of 15 NXP Semiconductors 74AHC126; 74AHCT126 Quad buffer/line driver; 3-state Table 8. Measurement points Type Input Output VM VM VX VY 74AHC126 0.5 × V CC 0.5 × V CC VOL + 0.3 V VOH − 0.3 V 74AHCT126 1.5 V 0.5 × VCC VOL + 0.3 V VOH − 0.3 V Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. RL = load resistance. S1 = test selection switch. Fig 8. Test circuitry for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74AHC126 VCC ≤ 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC 74AHCT126 3.0 V ≤ 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC |
Numéro de pièce similaire - 74AHC126D |
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Description similaire - 74AHC126D |
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