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KM681002CLT-10 Fiches technique(PDF) 3 Page - Samsung semiconductor

No de pièce KM681002CLT-10
Description  128Kx8 Bit High-Speed CMOS Static RAM5V Operating. Operated at Commercial and Industrial Temperature Ranges.
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Fabricant  SAMSUNG [Samsung semiconductor]
Site Internet  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

KM681002CLT-10 Fiches technique(HTML) 3 Page - Samsung semiconductor

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KM681002C/CL, KM681002CI/CLI
CMOS SRAM
PRELIMINARY
Revision 2.0
- 3 -
March 2000
PRELIMINARY
ABSOLUTE MAXIMUM RATINGS*
* Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Parameter
Symbol
Rating
Unit
Voltage on Any Pin Relative to VSS
VIN, VOUT
-0.5 to Vcc+0.5V
V
Voltage on VCC Supply Relative to VSS
VCC
-0.5 to 7.0
V
Power Dissipation
Pd
1
W
Storage Temperature
TSTG
-65 to 150
°C
Operating Temperature
Commercial
TA
0 to 70
°C
Industrial
TA
-40 to 85
°C
RECOMMENDED DC OPERATING CONDITIONS*(TA=0 to 70
°C)
* The above parameters are also guaranteed at industrial temperature range.
** VIL(Min) = -2.0V a.c(Pulse Width
≤ 8ns) for I ≤ 20mA.
*** VIH(Max) = VCC + 2.0V a.c (Pulse Width
≤ 8ns) for I ≤ 20mA.
Parameter
Symbol
Min
Typ
Max
Unit
Supply Voltage
VCC
4.5
5.0
5.5
V
Ground
VSS
0
0
0
V
Input High Voltage
VIH
2.2
-
VCC + 0.5***
V
Input Low Voltage
VIL
-0.5**
-
0.8
V
CAPACITANCE
*(TA=25
°C, f=1.0MHz)
* Capacitance is sampled and not 100% tested.
Item
Symbol
Test Conditions
MIN
Max
Unit
Input/Output Capacitance
CI/O
VI/O=0V
-
8
pF
Input Capacitance
CIN
VIN=0V
-
6
pF
DC AND OPERATING CHARACTERISTICS*(TA=0 to 70
°C, Vcc=5.0V±10%, unless otherwise specified)
* The above parameters are also guaranteed at industrial temperature range.
** VCC=5.0V
±5%, Temp.=25°C.
Parameter
Symbol
Test Conditions
Min
Max
Unit
Input Leakage Current
ILI
VIN = VSS to VCC
-2
2
µA
Output Leakage Current
ILO
CS=VIH or OE=VIH or WE=VIL
VOUT=VSS to VCC
-2
2
µA
Operating Current
ICC
Min. Cycle, 100% Duty
CS=VIL, VIN=VIH or VIL,
IOUT=0mA
10ns
-
80
mA
12ns
-
75
15ns
-
73
20ns
-
70
Standby Current
ISB
Min. Cycle, CS=VIH
-
30
mA
ISB1
f=0MHz, CS
≥VCC-0.2V,
VIN
≥VCC-0.2V or VIN≤0.2V
Normal
-
5
mA
L-ver.
-
0.5
Output Low Voltage Level
VOL
IOL=8mA
-
0.4
V
Output High Voltage Level
VOH
IOH=-4mA
2.4
-
V
VOH1**
IOH1=-0.1mA
-
3.95
V


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