Moteur de recherche de fiches techniques de composants électroniques |
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ULN2003ANE4 Fiches technique(PDF) 8 Page - Texas Instruments |
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ULN2003ANE4 Fiches technique(HTML) 8 Page - Texas Instruments |
8 / 26 page Open VCE Open ICEX Open VCE VI ICEX Open Open II(on) VI Open VCE IC II(off) Open VCE IC II hFE = IC II Open VCE IC VI(on) IF VF Open VR Open IR ULN2002A, ULN2003A, ULN2003AI, ULN2004A ULQ2003A, ULQ2004A SLRS027J – DECEMBER 1976 – REVISED JUNE 2010 www.ti.com PARAMETER MEASUREMENT INFORMATION Figure 1. ICEX Test Circuit Figure 2. ICEX Test Circuit Figure 3. II(off) Test Circuit Figure 4. II Test Circuit A. II is fixed for measuring VCE(sat), variable for measuring hFE. Figure 5. hFE, VCE(sat) Test Circuit Figure 6. VI(on) Test Circuit Figure 7. IR Test Circuit Figure 8. VF Test Circuit Figure 9. Propagation Delay-Time Waveforms 8 Submit Documentation Feedback Copyright © 1976–2010, Texas Instruments Incorporated Product Folder Link(s): ULN2002A ULN2003A ULN2003AI ULN2004A ULQ2003A ULQ2004A |
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