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74HC257DB Fiches technique(PDF) 10 Page - NXP Semiconductors |
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74HC257DB Fiches technique(HTML) 10 Page - NXP Semiconductors |
10 / 17 page 74HC_HCT257_5 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 05 — 13 January 2010 10 of 17 NXP Semiconductors 74HC257; 74HCT257 Quad 2-input multiplexer; 3-state Measurement points are given in Table 8 and test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistor. Fig 8. Test circuit for switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load Switch position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC257 VCC 6 ns 50 pF 1 k Ω open GND VCC 74HCT257 3 V 6 ns 50 pF 1 k Ω open GND VCC |
Numéro de pièce similaire - 74HC257DB |
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Description similaire - 74HC257DB |
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