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LSD3C5-64-XX-KP38-PF Fiches technique(PDF) 9 Page - LIGITEK electronics co., ltd.

No de pièce LSD3C5-64-XX-KP38-PF
Description  SINGLE DIGIT LED DISPLAY (0.31 Inch)
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Fabricant  LIGITEK [LIGITEK electronics co., ltd.]
Site Internet  http://www.ligitek.com
Logo LIGITEK - LIGITEK electronics co., ltd.

LSD3C5-64-XX-KP38-PF Fiches technique(HTML) 9 Page - LIGITEK electronics co., ltd.

  LSD3C5-64-XX-KP38-PF Datasheet HTML 1Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 2Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 3Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 4Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 5Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 6Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 7Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 8Page - LIGITEK electronics co., ltd. LSD3C5-64-XX-KP38-PF Datasheet HTML 9Page - LIGITEK electronics co., ltd.  
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Description
Test Condition
Test Item
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
The purpose of this test is the resistance
of the device under tropical for hours.
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
1.Ta=105
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
1.Under Room Temperature
2.If=10mA
3.t=1000 hrs (-24hrs, +72hrs)
1.Ta=105
℃±5℃&-40℃±5℃
(10min) (10min)
2.total 10 cycles
1.Ta=65
℃±5℃
2.RH=90 %~95%
3.t=240hrs
±2hrs
1.Ta=-40
℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
MIL-STD-202:103B
JIS C 7021: B-11
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Reference
Standard
MIL-STD-883:1008
JIS C 7021: B-10
JIS C 7021: B-12
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
This test intended to see soldering well
performed or not.
1.T.Sol=230
℃±5℃
2.Dwell time=5
±1sec
1.T.Sol=260
℃±5℃
2.Dwell time= 10
±1sec.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
Solder Resistance
Test
High Temperature
High Humidity Test
Thermal Shock Test
Solderability Test
Reliability Test:
Low Temperature
Storage Test
High Temperature
Storage Test
Operating Life Test
LSD3C5/64-XX/KP38-PF
PART NO.


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