LA16B-Y-S22 datasheet(5/5 Pages) LIGITEK

No de pièce	LA16B-Y-S22

Description	LED ARRAY

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Fabricant	LIGITEK [LIGITEK electronics co., ltd.]

Site Internet	http://www.ligitek.com

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Description

This test is conducted for the purpose

of detemining the resisance of a part

in electrical and themal stressed.

Reliability Test:

PART NO. LA16B/Y-S22

Test Item

Operating Life Test

1.Under Room Temperature

2.If=20mA

3.t=1000 hrs (-24hrs, +72hrs)

Test Condition

The purpose of this is the resistance

of the device which is laid under

condition of low temperature for hours.

The purpose of this test is the resistance

of the device under tropical for hous.

This test intended to determine the

thermal characteristic resistance

of the device to sudden exposures

at extreme changes in temperature

when soldering the lead wire.

The purpose of this is the resistance of

the device to sudden extreme changes

in high and low temperature.

High Temperature

High Humidity Test

Low Temperature

Storage Test

Thermal Shock Test

Solder Resistance

Test

1.T.Sol=260

℃±5℃

2.Dwell time= 10

±1sec.

1.Ta=65

℃±5℃

2.RH=90 %~95%

3.t=240hrs

±2hrs

1.Ta=105

℃±5℃&-40℃±5℃

(10min) (10min)

2.total 10 cycles

1.Ta=-40

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

1.Ta=105

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

High Temperature

Storage Test

The purpose of this is the resistance of

the device which is laid under ondition

of high temperature for hours.

This test intended to see soldering well

performed or not.

Solderability Test

1.T.Sol=230

℃±5℃

2.Dwell time=5

±1sec

Reference

Standard

MIL-STD-202: 210A

MIL-STD-750: 2031

JIS C 7021: A-1

MIL-STD-202: 208D

MIL-STD-750: 2026

MIL-STD-883: 2003

JIS C 7021: A-2

JIS C 7021: B-12

MIL-STD-202: 107D

MIL-STD-750: 1051

MIL-STD-883: 1011

MIL-STD-202:103B

JIS C 7021: B-11

MIL-STD-883:1008

JIS C 7021: B-10

MIL-STD-750: 1026

MIL-STD-883: 1005

JIS C 7021: B-1

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

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