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ISL21080CIH315Z-TK Fiches technique(PDF) 3 Page - Intersil Corporation

No de pièce ISL21080CIH315Z-TK
Description  300nA NanoPower Voltage References
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Fabricant  INTERSIL [Intersil Corporation]
Site Internet  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation

ISL21080CIH315Z-TK Fiches technique(HTML) 3 Page - Intersil Corporation

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FN6934.0
July 28, 2009
Absolute Voltage Ratings
Thermal Information
Max Voltage
VIN to GND. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +6.5V
VOUT to GND (10s) . . . . . . . . . . . . . . . . . . . . -0.5V to VOUT + 1V
ESD Rating
Human Body Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5500V
Machine Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .500V
Charged Device Model. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .>2kV
Thermal Resistance (Typical, Note 1)
θJA (°C/W)
3 Ld SOT-23 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
202.70
Continuous Power Dissipation (TA = +85°C) . . . . . . . . . . . . . 99mW
Storage Temperature Range . . . . . . . . . . . . . . . . . -65°C to +150°C
Pb-free Reflow Profile (Note 2). . . . . . . . . . . . . . . . . . see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Recommended Operating Conditions
Temperature Range (Industrial) . . . . . . . . . . . . . . . . -40°C to +85°C
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
IMPORTANT NOTE: All parameters having Min/Max specifications are guaranteed. Typ values are for information purposes only. Unless otherwise noted, all tests are at
the specified temperature and are pulsed tests, therefore: TJ = TC = TA
NOTES:
1.
θ
JA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
2. Post-reflow drift for the ISL21080 devices will range from 100µV to 1.0mV based on experimental results with devices on FR4 double sided
boards. The design engineer must take this into account when considering the reference voltage after assembly.
Electrical Specifications
(ISL21080-15, VOUT = 1.5V) VIN = 3.0V, TA = -40°C to +85°C, IOUT = 0, unless otherwise specified.
PARAMETER
DESCRIPTION
CONDITIONS
MIN
TYP
MAX
UNIT
VOUT
Output Voltage
1.5
V
VOA
VOUT Accuracy @ TA = +25°C
-0.5
+0.5
%
TC VOUT
Output Voltage Temperature Coefficient (Note 4)
50
ppm/°C
VIN
Input Voltage Range
2.7
5.5
V
IIN
Supply Current
0.31
1.5
µA
ΔVOUT /ΔVIN
Line Regulation
2.7 V < VIN < 5.5V
80
250
µV/V
ΔVOUT/ΔIOUT
Load Regulation
Sourcing: 0mA
≤ IOUT ≤ 7mA
10
100
µV/mA
Sinking: -7mA
≤ I
OUT ≤ 0mA
50
350
µV/mA
ISC
Short Circuit Current
TA = +25°C, VOUT tied to GND
50
mA
tR
Turn-on Settling Time
VOUT = ±0.1% with no load
4
ms
Ripple Rejection
f = 120Hz
-30
dB
eN
Output Voltage Noise
0.1Hz
≤ f ≤ 10Hz
30
µVP-P
VN
Broadband Voltage Noise
10Hz
≤ f ≤ 1kHz
52
µVRMS
Noise Density
f = 1kHz
1.1
µV/
√Hz
ΔVOUT/ΔTA
Thermal Hysteresis (Note 5)
ΔTA = +165°C
100
ppm
ΔVOUT/Δt
Long Term Stability (Note 6)
TA = +25°C
50
ppm
NOTES:
3. Post-assembly x-ray inspection may also lead to permanent changes in device output voltage and should be minimized or avoided. Most
inspection equipment will not affect the FGA reference voltage, but if x-ray inspection is required, it is advisable to monitor the reference output
voltage to verify excessive shift has not occurred.
4. Over the specified temperature range. Temperature coefficient is measured by the box method whereby the change in VOUT is divided by the
temperature range; in this case, -40°C to +85°C = +125°C.
5. Thermal Hysteresis is the change of VOUT measured @ TA = +25°C after temperature cycling over a specified range, ΔTA. VOUT is read initially
at TA = +25°C for the device under test. The device is temperature cycled and a second VOUT measurement is taken at +25°C. The difference
between the initial VOUT reading and the second VOUT reading is then expressed in ppm. For Δ TA = +125°C, the device under test is cycled
from +25°C to +85°C to -40°C to +25°C.
6. Long term drift is logarithmic in nature and diminishes over time. Drift after the first 1000 hours will be approximately 10ppm/
√1khrs.
ISL21080


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