TLC372, TLC372Q, TLC372Y

LinCMOS

™ DUAL DIFFERENTIAL COMPARATORS

SLCS114B – NOVEMBER 1983 – REVISED MARCH 1999

8

POST OFFICE BOX 655303

PARAMETER MEASUREMENT INFORMATION

Response time is defined as the interval between the application of an input step function and the instant when the

output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the leading

edge of the input pulse, while response time, high-to-low-level output, is measured from the trailing edge of the input

pulse. Response-time measurement at low input signal levels can be greatly affected by the input offset voltage. The

offset voltage should be balanced by the adjustment at the inverting input as shown in Figure 3, so that the circuit

is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive, causes the output to change

state.

Low-to-High-

Level Output

DUT

5.1 k

Ω

1

µF

0.1

µF

1 k

Ω

50

Ω

CL

(see Note A)

VDD

Pulse

Generator

Input Offset Voltage

Compensation Adjustment

10

Ω

10 Turn

1 V

–1 V

Overdrive

Input

100 mV

Overdrive

Input

tf

tPHL

10%

50%

90%

90%

50%

tr

tPLH

High-to-Low-

Level Output

TEST CIRCUIT

VOLTAGE WAVEFORMS

10%

100 mV

NOTE A: CL includes probe and jig capacitance.

Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms