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CDC2536 Fiches technique(PDF) 4 Page - Texas Instruments

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No de pièce CDC2536
Description  3.3-V PHASE-LOCK LOOP CLOCK DRIVER WITH 3-STATE OUTPUTS
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Fabricant  TI [Texas Instruments]
Site Internet  http://www.ti.com
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CDC2536 Fiches technique(HTML) 4 Page - Texas Instruments

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CDC2536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS377D – APRIL 1994 – REVISED OCTOBER 1998
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
I/O
DESCRIPTION
NAME
NO.
I/O
DESCRIPTION
CLKIN
3
I
Clock input. CLKIN provides the clock signal to be distributed by the CDC2536 clock-driver circuit. CLKIN
provides the reference signal to the integrated PLL that generates the clock output signals. CLKIN must have
a fixed frequency and fixed phase for the phase-lock loop to obtain phase lock. Once the circuit is powered up
and a valid CLKIN signal is applied, a stabilization time is required for the PLL to phase lock the feedback signal
to its reference signal.
CLR
24
I
CLR is used for testing purposes only.
FBIN
26
I
Feedback input. FBIN provides the feedback signal to the internal PLL. FBIN must be hardwired to one of the
six clock outputs to provide frequency and phase lock. The internal PLL adjusts the output clocks to obtain zero
phase delay between the FBIN and differential CLKIN inputs.
OE
5
I
Output enable. OE is the output enable for all outputs. When OE is low, all outputs are enabled. When OE is
high, all outputs are in the high-impedance state. Since the feedback signal for the PLL is taken directly from
an output, placing the outputs in the high-impedance state interrupts the feedback loop; therefore, when a
high-to-low transition occurs at OE, enabling the output buffers, a stabilization time is required before the PLL
obtains phase lock.
SEL
4
I
Output configuration select. SEL selects the output configuration for each output bank (e.g. 1
×, 1/2×, or 2×).
(see Tables 1 and 2).
TEST
25
I
TEST is used to bypass the PLL circuitry for factory testing of the device. When TEST is low, all outputs operate
using the PLL circuitry. When TEST is high, the outputs are placed in a test mode that bypasses the PLL
circuitry. TEST should be grounded for normal operation.
1Y1 – 1Y3
7, 10, 13
O
These outputs are configured by SEL to transmit one-half or one-fourth the frequency of the VCO. The
relationship between the CLKIN frequency and the output frequency is dependent on SEL. The duty cycle of
the Y output signals is nominally 50%, independent of the duty cycle of the CLKIN signal. Each output has an
internal series resistor to dampen transmission-line effects and improve the signal integrity at the load.
2Y1 – 2Y3
22, 19, 16
O
These outputs transmit one-half the frequency of the VCO. The relationship between the CLKIN frequency and
the output frequency is dependent on the frequency of the output being fed back to FBIN. The duty cycle of the
Y output signals is nominally 50%, independent of the duty cycle of the CLKIN signal. Each output has an
internal series resistor to dampen transmission-line effects and improve the signal integrity at the load.


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