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OP282GSZ-REEL7 Fiches technique(PDF) 4 Page - Analog Devices

No de pièce OP282GSZ-REEL7
Description  Dual/Quad Low Power, High Speed JFET Operational Amplifiers
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Fabricant  AD [Analog Devices]
Site Internet  http://www.analog.com
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OP282GSZ-REEL7 Fiches technique(HTML) 4 Page - Analog Devices

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OP282/OP482
Rev. F | Page 4 of 16
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameters
Ratings
Supply Voltage
±18 V
Input Voltage
±18 V
Differential Input Voltage1
36 V
Output Short-Circuit Duration
Indefinite
Storage Temperature Range
P-Suffix (N), S-Suffix (R), RM Packages
−65°C to +150°C
Operating Temperature Range
OP282G, OP282A, OP482G
−40°C to +85°C
Junction Temperature Range
P-Suffix (N), S-Suffix (R), RM Packages
−65°C to +150°C
Lead Temperature Range (Soldering 60 sec)
300°C
1 For supply voltages less than ±18 V, the absolute maximum input voltage is
equal to the supply voltage.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 3.
Package Type
θJA1
θJC
Unit
8-Lead MSOP [RM]
206
44
°C/W
8-Lead SOIC (S-Suffix) [R]
157
56
°C/W
14-Lead PDIP (P-Suffix) [N]
83
39
°C/W
14-Lead SOIC (S-Suffix) [R]
104
36
°C/W
1 θJA is specified for the worst-case conditions; i.e., θJA is specified for device in
socket for CERDIP, PDIP; θJA is specified for device soldered in circuit board
for SOIC or MSOP package.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate
on the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.


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