Moteur de recherche de fiches techniques de composants électroniques |
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TA1310ANG Fiches technique(PDF) 41 Page - Toshiba Semiconductor |
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TA1310ANG Fiches technique(HTML) 41 Page - Toshiba Semiconductor |
41 / 106 page TA1310ANG 2005-09-20 41 (TEST CONDITIONS VCC = 9 V / 5 V, Ta = 25 ± 3°C) SW MODE NOTE ITEM SW54 SW55 SW56 MEASUREMENT METHOD P16 Sharpness Peak Frequency A B OPEN 1) Set the bus control data to the preset value. 2) Set SW54 to A and input a sweep signal to TP54. 3) Set the amplitude of #54 to 20 mVp-p. 4) Set the unicolor to the maximum (111111), set the brightness to the center (1000000), set the RGB cutoff to the center (10000000), turn the Y mute off (0), turn test mode on (0), and set the picture sharpness to the maximum (111111). 5) Connect an emitter-follower to TP13 (R OUT) and use a spectrum analyzer to observe TP13 (R OUT). 6) Seek the peak point frequency FAP as shown in the diagram. Note 1: When testing, see the picture sharpness test circuit diagram. First turn ACB mode off (bus control). Note 2: Ensure the composite signal is always input to pin 38 (SYNC IN). |
Numéro de pièce similaire - TA1310ANG |
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Description similaire - TA1310ANG |
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