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74AHC157BQ Fiches technique(PDF) 10 Page - NXP Semiconductors |
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74AHC157BQ Fiches technique(HTML) 10 Page - NXP Semiconductors |
10 / 16 page 74AHC_AHCT157_2 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 02 — 9 November 2007 10 of 16 NXP Semiconductors 74AHC157; 74AHCT157 Quad 2-input multiplexer Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator CL = Load capacitance including jig and probe capacitance RL = Load resistor S1 = Test selection switch Fig 9. Load circuitry for switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open PULSE GENERATOR Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74AHC157 VCC 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC 74AHCT157 3.0 V 3.0 ns 15 pF, 50 pF 1 k Ω open GND VCC |
Numéro de pièce similaire - 74AHC157BQ |
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Description similaire - 74AHC157BQ |
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