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UAA2080T Datasheet(Fiches technique) 26 Page - NXP Semiconductors

Numéro de pièce UAA2080T
Description  Advanced pager receiver
Télécharger  44 Pages
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Fabricant  PHILIPS [NXP Semiconductors]
Site Internet  http://www.nxp.com
Logo 

 26 page
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1996 Jan 15
26
Philips Semiconductors
Product specification
Advanced pager receiver
UAA2080
Table 6
AC test conditions (notes 1 and 2)
Notes
1. The tests are executed without load on pins TPI and TPQ.
2. All minimum and maximum values correspond to a bit error rate (BER)
3100 in the wanted signal (P1).
3. The BER measurement is started 5 ms (ton(max)) after VRE goes HIGH; BER is then measured for 100 bits
(BER
3100).
SYMBOL
PARAMETER
CONDITIONS
TEST SIGNALS
αa
adjacent channel selectivity;
Fig.12(b)
f2 =f1 ±∆fCS
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αa(min)
αc
co-channel rejection; Fig.12(b) f2 =f1 ± up to 3 kHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 −αc(max)
αsp
spurious immunity; Fig.12(b)
f2 = 100 kHz to 2 GHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αsp( min)
αim
intermodulation immunity;
Fig.12(c)
f2 =f1 ±∆fcs; f3 =f1 ± 2∆fcs
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: unmodulated
P2 =P1 + αim(min)
generator 3: modulated test signal 2
P3 =P2
αbl
blocking immunity; Fig.12(b)
f2 =f1 ± 1 MHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αbl(min)
foffset
frequency offset range;
Fig.12(a)
deviation =
±4.0 kHz, f1 =fi(RF) ± 2 kHz (foffset(min))
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
∆f
dev
deviation range; Fig.12(a)
deviation =
±2.5 to ±7 kHz; (∆fdev(min) to ∆fdev(max))
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
ton
receiver turn-on time;
Fig.12(a)
note 3
generator 1: modulated test signal 1
P1 =Pi(ref) +10dB




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