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ZL50075 Fiches technique(PDF) 28 Page - Zarlink Semiconductor Inc |
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ZL50075 Fiches technique(HTML) 28 Page - Zarlink Semiconductor Inc |
28 / 60 page ZL50075 Data Sheet 28 Zarlink Semiconductor Inc. Note: After the PWR reset is removed, and on the application of a suitable master clock input, it takes approximately 1 ms for the internal initialization to complete • Automatic block initialization of the Connection Memory to all zeros occurs, without microprocessor intervention • All Group Control Registers are preset to 000C000C hex, corresponding to rates of 65 Mbps, no link inversions, no fractional output bit advancements, internal clock source, and no input sample point delays • The Input Clock Control Register is preset to 0DB hex, corresponding to: - All clock inputs set to negative logic sense - All frame pulse inputs set to negative logic sense - All input frame pulses set to ST-BUS timing • The Output Clock Control Register is pre-set to 060D1C3C hex, corresponding to: - All clock outputs set to negative logic sense - All frame pulse outputs set to negative logic sense - All output frame pulses set to ST-BUS timing - All output clock source selections to internal - Clock outputs, CKo0 - 1 are preset to rates of 65 MHz and 32 MHz, respectively Note: If the master clock input, CKi0, is not available, the microprocessor port will assert BERR on all accesses and read cycles. 12.0 IEEE 1149.1 Test Access Port The JTAG test port is implemented to meet the mandatory requirements of the IEEE 1149.1 (JTAG) standard. The operation of the boundary-scan circuity is controlled by an external Test Access Port (TAP) Controller. The ZL50075 uses the public instructions defined in IEEE 1149.1, with the provision of a 16-bit Instruction Register, and three scannable Test Data Registers: Boundary Scan Register, Bypass Register and Device Identification Register. 12.1 Test Access Port (TAP) The Test Access Port (TAP) accesses the ZL50075 test functions. The interface consists of 4 input and 1 output signal. as follows: • Test Clock (TCK) - TCK provides the clock for the test logic. The TCK does not interfere with any on-chip clock and thus remains independent in the functional mode. The TCK permits shifting of test data into or out of the Boundary-Scan register cells concurrently with the operation of the device and without interfering with the on-chip logic. • Test Mode Select (TMS) - The TAP Controller uses the logic signals received at the TMS input to control test operations. The TMS signals are sampled at the rising edge of the TCK pulse. This pin is internally pulled to VDD_IO when it is not driven from an external source. • Test Data Input (TDi) - Serial input data applied to this port is fed either into the instruction register or into a test data register, depending on the sequence previously applied to the TMS input. Both registers are described in a subsequent section. The received input data is sampled at the rising edge of TCK pulses. This pin is internally pulled to VDD_IO when it is not driven from an external source. • Test Data Output (TDo) - Depending on the sequence previously applied to the TMS input, the contents of either the instruction register or data register are serially shifted out towards the TDo. The data out of the TDo is clocked on the falling edge of the TCK pulses. When no data is shifted through the boundary scan cells, the TDo driver is set to a high impedance state. |
Numéro de pièce similaire - ZL50075 |
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Description similaire - ZL50075 |
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