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MC100E195FNR2G Fiches technique(PDF) 6 Page - ON Semiconductor

No de pièce MC100E195FNR2G
Description  5V ECL Programmable Delay Chip
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Fabricant  ONSEMI [ON Semiconductor]
Site Internet  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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MC10E195, MC100E195
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Table 8. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 13)
Symbol
Characteristic
0°C
25°C
85°C
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
fMAX
Maximum Toggle Frequency
> 1.0
GHz
tPLH
tPHL
Propagation Delay
IN to Q; Tap = 0
IN to Q; Tap = 127
EN to Q; Tap = 0
D7 to CASCADE
1210
3200
1250
300
1360
3570
1450
450
1510
3970
1650
700
1240
3270
1275
300
1390
3630
1475
450
1540
4030
1675
700
1440
3885
1350
300
1590
4270
1650
450
1765
4710
1950
700
ps
tRANGE
Programmable Range
tPD (max) − tPD (min)
2000
2175
2050
2240
2375
2580
ps
Dt
Step Delay (Note 14)
D0 High
D1 High
D2 High
D3 High
D4 High
D5 High
D6 High
55
115
250
505
1000
17
34
68
136
272
544
1088
105
180
325
620
1190
55
115
250
515
1030
17.5
35
70
140
280
560
1120
105
180
325
620
1220
65
140
305
620
1240
21
42
84
168
336
672
1344
120
205
380
740
1450
ps
Lin
Linearity (Note 15)
D1
D0
D1
D0
D1
D0
tSKEW
Duty Cycle Skew
tPHL−tPLH (Note 16)
±30
±30
±30
ps
tJITTER
Random Clock Jitter (RMS)
< 5
< 5
< 5
ps
ts
Setup Time
D to LEN
D to IN (Note 17)
EN to IN (Note 18)
200
800
200
0
200
800
200
0
200
800
200
0
ps
th
Hold Time
LEN to D
IN to EN (Note 19)
500
0
250
500
0
250
500
0
250
ps
tR
Release Time
EN to IN (Note 20)
SET MAX to LEN
SET MIN to LEN
300
800
800
300
800
800
300
800
800
ps
tjit
Jitter
< 5
< 5
< 5
ps
tr
tf
Output Rise/Fall Time
20−80% (Q)
20−80% (CASCADE)
125
300
225
450
325
650
125
300
225
450
325
650
125
300
225
450
325
650
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
13.10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
14.Specification limits represent the amount of delay added with the assertion of each individual delay control pin. The various combinations
of asserted delay control inputs will typically realize D0 resolution steps across the specified programmable range.
15.The linearity specification guarantees to which delay control input the programmable steps will be monotonic (i.e. increasing delay steps for
increasing binary counts on the control inputsDn). Typically the device will be monotonic to the D0 input, however under worst case conditions
and process variation, delays could decrease slightly with increasing binary counts when the D0 input is the LSB. With the D1 input as the
Least Significant Bit (LSB), the device is guaranteed to be monotonic over all specified environmental conditions and process variation.
16.Duty cycle skew guaranteed only for differential operation measured from the cross point of the input to the cross point of the output.
17.This setup time defines the amount of time prior to the input signal the delay tap of the device must be set.
18.This setup time is the minimum time that EN must be asserted prior to the next transition of IN/IN to prevent an output response greater than
±75 mV to that IN/IN transition.
19.This hold time is the minimum time that EN must remain asserted after a negative going IN or positive going IN to prevent an output response
greater than ±75 mV to that IN/IN transition.
20.This release time is the minimum time that EN must be deasserted prior to the next IN/IN transition to ensure an output response that meets
the specified IN to Q propagation delay and transition times.


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