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CS5332 Fiches technique(PDF) 5 Page - ON Semiconductor |
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CS5332 Fiches technique(HTML) 5 Page - ON Semiconductor |
5 / 20 page CS5332 http://onsemi.com 5 ELECTRICAL CHARACTERISTICS (continued) (0°C < TA < 70°C; 0°C < TJ < 125°C; 4.7 V < VCCL < 14 V; 8.0 V < VCCH < 20 V; CGATE(H) = 3.3 nF, CGATE(L) = 3.3 nF, RR(OSC) = 32.4 k, CCOMP = 1.0 nF, CSS = 0.1 μF, CREF = 0.1 μF, DAC Code 10000, CVCC = 1.0 μF, ILIM ≥ 1.0 V; unless otherwise specified.) Characteristic Unit Max Typ Min Test Conditions Power−Good Output Power Good Fault Delay CSREF = VDAC to VDAC ± 15% 25 50 125 μs Output Low Voltage CSREF = 1.0 V, IPWRGD = 4.0 mA − 0.25 0.40 V Output Leakage Current CSREF = 1.45 V, PWRGD = 5.5 V − 0.1 10.0 μA Lower Threshold % of Nominal VID Code −18 −14 −10 % Upper Threshold − 1.9 2.0 2.1 V Voltage Feedback Error Amplifier VFB Bias Current (Note 2) 1.0 V < VFB < 1.9 V 28.5 31 33.5 μA COMP Source Current COMP = 0.5 V to 2.0 V; VFB = 1.8 V; DAC = 00000 15 30 60 μA COMP Sink Current COMP = 0.5 V to 2.0 V; VFB = 1.9 V; DAC = 00000 15 30 60 μA COMP Max Voltage VFB = 1.8 V COMP Open; DAC = 00000 2.4 2.7 − V COMP Min Voltage VFB = 1.9 V COMP Open; DAC = 00000 − 0.1 0.2 V Transconductance −10 μA < ICOMP < +10 μA − 32 − mmho Output Impedance − − 2.5 − MΩ Open Loop DC Gain Note 3 60 90 − dB Unity Gain Bandwidth 0.01 μF COMP Capacitor − 400 − kHz PSRR @ 1.0 kHz − − 70 − dB Soft Start Soft Start Charge Current 0.2 V ≤ SS ≤ 3.0 V 15 30 50 μA Soft Start DisCharge Current 0.2 V ≤ SS ≤ 3.0 V 4.0 7.5 13.0 μA Hiccup Mode Charge/Discharge Ratio − 3.0 4.0 − − Peak Soft Start Charge Voltage − 3.3 4.0 4.2 V Soft Start DisCharge Threshold Voltage − 0.20 0.27 0.34 V PWM Comparators Minimum Pulse Width Measured from CSx to GATE(H)x V(VFB) = V(CSREF) = 1.0 V, V(COMP) = 1.5 V 60 mV step applied between VCSX and VCREF − 350 515 ns Channel Start Up Offset V(CS1) = V(CS2) = V(VFB) = V(CSREF) = 0 V; Measure V(COMP) when GATE(H)1, GATE(H)2, switch high 0.3 0.4 0.5 V 2. The VFB Bias Current changes with the value of ROSC per Figure 4. 3. Guaranteed by design. Not tested in production. |
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