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TPA100RL Fiches technique(PDF) 6 Page - STMicroelectronics |
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TPA100RL Fiches technique(HTML) 6 Page - STMicroelectronics |
6 / 10 page SMP50 / SMTPA / TPA 6/10 Figure 12: Test circuit 3 for dynamic IH parameters Figure 11: Test circuit 2 for IBO and VBO parameters 220V 50Hz 1/4 R1 = 140 Ω R2 = 240 Ω K ton = 20ms IBO measurement VBO measurement Vout DUT TEST PROCEDURE Pulse test duration (tp = 20ms): V selection: ● ● ● ● for Bidirectional devices = Switch K is closed for Unidirectional devices = Switch K is open Device with V < 200V V = 250 V , R1 = 140 OUT BO OUT RMS ➔ Ω Device with V 200V V = 480 V , R2 = 240 BO OUT RMS ≤Ω ➔ TEST PROCEDURE 1/ Adjust the current level at the I value by short circuiting the AK of the D.U.T. 2/ Fire the D.U.T. with a surge current H ➔ I= 10A, 10/1000µs. 3/ The D.U.T. will come back off-state within 50ms maximum. PP This is a GO-NOGO test which allows to confirm the holding current (I ) level in a functional test circuit. H R VBAT =-48 V Surge generator D.U.T |
Numéro de pièce similaire - TPA100RL |
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Description similaire - TPA100RL |
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