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74F598 Datasheet(Fiches technique) 6 Page - NXP Semiconductors

Numéro de pièce 74F598
Description  8-bit shift register with input storage registers 3-State
Télécharger  14 Pages
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Fabricant  PHILIPS [NXP Semiconductors]
Site Internet  http://www.nxp.com
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 6 page
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Philips Semiconductors
Product specification
74F598
8-bit shift register with input storage registers (3-State)
1991 Oct 21
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN
TYP2
MAX
Qs
VCC = MIN,
VIL = MAX,
IOH = –1mA
±10%VCC
2.5
V
VOH
High-level output voltage
VIL = MAX,
±5%VCC
2.7
3.4
V
I/On
VIH = MIN,
VIL = MAX,
IOH = –3mA
±10%VCC
2.4
V
±5%VCC
2.7
3.3
V
VOL
Low-level output voltage
VCC = MIN, VIL = MAX,
±10%VCC
0.30
0.50
V
VIH = MIN, IOL = MAX
±5%VCC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
-1.2
V
II
Input current at maximum input voltage
others
VCC = MAX, VI = 7.0V
100
µA
I/On
VCC = MAX, VI = 5.5V
1
mA
IIH
High–level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low–level input current
VCC = MAX, VI = 0.5V
–20
µA
IOZH + IIH
Off–state output current,
High–level voltage applied
I/On
VCC = MAX, VO = 2.7V
70
µA
IOZL + IIL
Off–state output current,
Low–level voltage applied
only
VCC = MAX, VO = 0.5V
–70
µA
IOS
Short–circuit output current3
VCC = MAX
-60
-150
mA
ICCH
68
100
mA
ICC
Supply current (total)
ICCL
VCC = MAX
80
110
mA
ICCZ
73
105
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of High-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.




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