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74F579 Fiches technique(PDF) 6 Page - NXP Semiconductors |
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74F579 Fiches technique(HTML) 6 Page - NXP Semiconductors |
6 / 14 page Philips Semiconductors Product specification 74F579 8-bit bidirectional binary counter (3-State) 1992 May 04 6 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT TC VCC = MIN, V MAX IO = 1mA ±10%VCC 2.5 V VO High level output voltage TC VIL = MAX, VIH = MIN IOH = –1mA ±5%VCC 2.7 3.4 V VOH High-level output voltage I/O IH (VIL = 0.0V, VIH =4 5V IO = 3mA ±10%VCC 2.4 3.3 V I/On VIH = 4.5V for MR, CP inputs) IOH = –3mA ±5%VCC 2.7 3.3 V VO Low level output voltage VCC = MIN, V MAX IO = MAX ±10%VCC 0.35 0.50 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOL = MAX, ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V I Input current I/On VCC = MAX, VI = 5.5V 1 mA II at maximum input voltage others VCC = MAX, VI = 7.0V 100 µA IIH High-level input current except VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current I/On VCC = MAX, VI = 0.5V –0.6 mA IOZH+ IIH Off-state output current High-level voltage applied I/O VCC = MAX, VO = 2.7V 70 µA IOZL+ IIL Off-state output current Low-level voltage applied I/On VCC = MAX, VO = 0.5V –600 µA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICCH 95 135 mA ICC Supply current (total) ICCL VCC = MAX 105 145 mA ICCZ 105 150 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under Recommended Operating Conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter test, IOS tests should be performed last. |
Numéro de pièce similaire - 74F579 |
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Description similaire - 74F579 |
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