Philips Semiconductors

Product specification

74F50109

Synchronizing dual J–K positive edge-triggered

flip-flop with metastable immune characteristics

September 14, 1990

6

ABSOLUTE MAXIMUM RATINGS

(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the

operating free air temperature range.)

SYMBOL

PARAMETER

RATING

UNIT

Supply voltage

–0.5 to +7.0

V

Input voltage

–0.5 to +7.0

V

Input current

–30 to +5

mA

Voltage applied to output in high output state

V

Current applied to output in low output state

40

mA

Operating free air temperature range

0 to +70

Storage temperature range

–65 to +150

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

LIMITS

UNIT

MIN

NOM

MAX

Supply voltage

4.5

5.0

5.5

V

High–level input voltage

2.0

V

Low–level input voltage

0.8

V

Input clamp current

–18

mA

High–level output current

–1

mA

Low–level output current

20

mA

Operating free air temperature range

0

+70

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

LIMITS

UNIT

MIN

MAX

High–level output voltage

MAX,

CC

2.5

V

CC

2.7

3.4

V

Low–level output voltage

MAX,

CC

0.30

0.50

V

CC

0.30

0.50

V

Input clamp voltage

-0.73

-1.2

V

Input current at maximum input voltage

100

µA

High–level input current

20

µA

Low–level input current

Jn, Kn

-250

µA

CPn, SDn, RDn

-20

µA

-60

-150

mA

22

32

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any