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74F350 Fiches technique(PDF) 5 Page - NXP Semiconductors

No de pièce 74F350
Description  4-bit shifter
Download  6 Pages
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Fabricant  PHILIPS [NXP Semiconductors]
Site Internet  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F350 Fiches technique(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors FAST Products
Product specification
74F350
4-bit shifter
March 20, 1989
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
VOH
High-level output voltage
VCC = MIN, VIL = MAX
±10%VCC
2.4
V
VOH
High-level output voltage
VIH = MIN, IOH = MAX
±5%VCC
2.7
3.4
V
VOL
Low-level output voltage
VCC = MIN, VIL = MAX
±10%VCC
0.35
0.50
V
VOL
Low-level output voltage
VIH = MIN, IOL = MAX
±5%VCC
0.35
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–1.2
mA
IOZH
Off-state output current,
High-level voltage applied
VCC = MAX, VO = 2.7V
50
µA
IOZL
Off-state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
µA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
ICCH
VCC = MAX
22
35
mA
ICC
Supply current (total)
ICCL
VCC = MAX
26
41
mA
ICCZ
26
42
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST
CONDITION
LIMITS
UNIT
SYMBOL
PARAMETER
TEST
CONDITION
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500Ω
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
UNIT
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
In to Yn
Waveform 1
3.0
2.5
4.5
4.0
6.0
5.5
3.0
2.5
7.0
6.5
ns
tPLH
tPHL
Propagation delay
Sn to Yn
Waveform 1
4.0
3.0
7.8
6.5
10.0
8.5
4.0
3.0
11.0
9.5
ns
tPZH
tPZL
Output Enable time to
High or Low level
Waveform 2
Waveform 3
2.5
4.0
5.0
7.0
7.0
9.0
2.5
4.0
8.0
10.0
ns
tPHZ
tPLZ
Output Disable time to
High or Low level
Waveform 2
Waveform 3
2.0
2.0
3.9
4.0
5.5
5.5
2.0
2.0
6.5
6.5
ns


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