Philips Semiconductors

Product specification

74ABT373A

Octal transparent latch (3-State)

1995 Feb 17

5

DC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

to +85

°C

UNIT

Min

Typ

Max

Min

Max

Input clamp voltage

–0.9

–1.2

–1.2

V

2.5

2.9

2.5

V

High-level output voltage

3.0

3.4

3.0

V

2.0

2.4

2.0

V

Low-level output voltage

0.3

0.55

0.55

V

Power-up output low

0.13

0.55

0.55

V

Input leakage current

±0.01

±1.0

±1.0

µA

Power-off leakage current

±5.0

±100

±100

µA

Power-up/down 3-State

output current

±5.0

±50

±50

µA

3-State output High current

0.1

50

50

µA

3-State output Low current

–0.1

–50

–50

µA

Output High leakage current

5.0

50

50

µA

–50

–100

–180

–50

–180

mA

100

250

250

µA

Quiescent supply current

24

30

30

mA

Quiescent su

ly current

100

250

250

µA

Additional supply current per

0.5

1.5

1.5

mA

NOTES:

1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2. This is the increase in supply current for each input at 3.4V.

3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.

AC CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

WAVEFORM

UNIT

Min

Typ

Max

Min

Max

Propagation delay

Dn to Qn

2

1.4

1.4

3.2

3.6

4.2

4.7

1.4

1.4

4.7

5.1

ns

Propagation delay

E to Qn

1

1.4

1.9

3.2

3.7

4.2

4.8

1.4

1.9

4.8

5.1

ns

Output enable time

to High and Low level

4

5

1.2

2.1

3.1

4.2

4.2

5.2

1.2

2.1

5.1

5.7

ns

Output disable time

from High and Low level

4

5

1.3

1.2

3.4

3.0

4.6

4.1

1.3

1.2

5.1

4.3

ns