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54ABT373CMSAMX Fiches technique(PDF) 3 Page - National Semiconductor (TI) |
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54ABT373CMSAMX Fiches technique(HTML) 3 Page - National Semiconductor (TI) |
3 / 16 page Absolute Maximum Ratings (Note 1) If MilitaryAerospace specified devices are required please contact the National Semiconductor Sales OfficeDistributors for availability and specifications Storage Temperature b 65 Cto a150 C Ambient Temperature under Bias b 55 Cto a125 C Junction Temperature under Bias Ceramic b 55 Cto a175 C Plastic b 55 Cto a150 C VCC Pin Potential to Ground Pin b 05V to a70V Input Voltage (Note 2) b 05V to a70V Input Current (Note 2) b 30 mA to a50 mA Voltage Applied to Any Output in the Disabled or Power-Off State b 05V to a55V in the HIGH State b 05V to VCC Current Applied to Output in LOW State (Max) twice the rated IOL (mA) DC Latchup Source Current OE Pin b 150 mA (Across Comm Operating Range) Other Pins b500 mA Over Voltage Latchup (IO) 10V Note 1 Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired Functional operation under these conditions is not implied Note 2 Either voltage limit or current limit is sufficient to protect inputs Recommended Operating Conditions Free Air Ambient Temperature Military b 55 Cto a125 C Commercial b 40 Cto a85 C Supply Voltage Military a 45V to a55V Commercial a 45V to a55V Minimum Input Edge Rate (DV Dt) Data Input 50 mVns Enable Input 20 mVns DC Electrical Characteristics Symbol Parameter ABT373 Units VCC Conditions Min Typ Max VIH Input HIGH Voltage 20 V Recognized HIGH Signal VIL Input LOW Voltage 08 V Recognized LOW Signal VCD Input Clamp Diode Voltage b 12 V Min IIN eb18 mA VOH Output HIGH Voltage 54ABT74ABT 25 IOH eb3mA 54ABT 20 V Min IOH eb24 mA 74ABT 20 IOH eb32 mA VOL Output LOW Voltage 54ABT 055 V Min IOL e 48 mA 74ABT 055 IOL e 64 mA IIH Input HIGH Current 5 m A Max VIN e 27V (Note 2) 5VIN e VCC IBVI Input HIGH Current Breakdown Test 7 m A Max VIN e 70V IIL Input LOW Current b 5 m A Max VIN e 05V (Note 2) b 5VIN e 00V VID Input Leakage Test 475 V 00 IID e 19 mA All Other Pins Grounded IOZH Output Leakage Current 50 m A0 b 55V VOUT e 27V OE e 20V IOZL Output Leakage Current b 50 m A0 b 55V VOUT e 05V OE e 20V IOS Output Short-Circuit Current b 100 b 275 mA Max VOUT e 00V ICEX Output High Leakage Current 50 m A Max VOUT e VCC IZZ Bus Drainage Test 100 m A 00 VOUT e 55V All Others GND ICCH Power Supply Current 50 m A Max All Outputs HIGH ICCL Power Supply Current 30 mA Max All Outputs LOW ICCZ Power Supply Current 50 m A Max OE e VCC All Others at VCC or GND ICCT Additional ICC Input Outputs Enabled 25 mA VI e VCC b 21V Outputs TRI-STATE 25 mA Max Enable Input VI e VCC b 21V Outputs TRI-STATE 25 mA Data Input VI e VCC b 21V All Others at VCC or GND ICCD Dynamic ICC No Load mA Max Outputs Open LE e VCC (Note 2) 012 MHz OE e GND (Note 1) One Bit Toggling 50% Duty Cycle Note 1 For 8 bits toggling ICCD k 08 mAMHz Note 2 Guaranteed but not tested 3 |
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