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BZX55C56 Fiches technique(PDF) 2 Page - Fairchild Semiconductor |
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BZX55C56 Fiches technique(HTML) 2 Page - Fairchild Semiconductor |
2 / 5 page ©2004 Fairchild Semiconductor Corporation BZX55C2V4 - BZX55C91, Rev. B1 Electrical Characteristics (Continued) T A=25°C unless otherwise noted Notes: 1. Zener Voltage (VZ) The zener voltage is measured with the device junction in the thermal equilibrium at the lead temperature (TL) at 30°C ± 1°C and 3/8” lead length. 2. Maximum Zener Current Ratings (IZM) The maximum current handling capability on a worst case basis is limited by the actual zener voltage at the operation point and the power derating curve. Device VZ (V) @ IZ (Note 1) ZZ @ IZ ( Ω) Test Current IZ (mA) IR (µA) @ VR IZM (mA) (Note 2) Min. Max. Ta = 25 °C Ta = 125 °CV R (V) BZX55C43 BZX55C47 BZX55C51 BZX55C56 BZX55C62 40 44 48 52 58 46 50 54 60 66 90 110 125 135 150 5 2.5 5 5 5 0.1 0.1 0.1 0.1 0.1 5 5 10 10 10 32 35 38 42 47 9.2 8.5 7.8 7.0 6.4 BZX55C68 BZX55C75 BZX55C82 BZX55C91 64 70 77 85 72 80 87 96 160 170 200 250 5 5 5 1 0.1 0.1 0.1 0.1 10 10 10 10 51 56 62 69 5.9 5.3 4.8 4.3 VF Forward Voltage = 1.3V Max @ IF = 100mA |
Numéro de pièce similaire - BZX55C56 |
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Description similaire - BZX55C56 |
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