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74AUP1GU04GM Fiches technique(PDF) 11 Page - NXP Semiconductors |
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74AUP1GU04GM Fiches technique(HTML) 11 Page - NXP Semiconductors |
11 / 18 page 9397 750 14689 © Koninklijke Philips Electronics N.V. 2005. All rights reserved. Product data sheet Rev. 01 — 10 August 2005 11 of 18 Philips Semiconductors 74AUP1GU04 Low-power unbuffered inverter [1] For measuring enable and disable times RL =5kΩ, for measuring propagation delays, setup and hold times and pulse width RL = 1 MΩ. Test data is given in Table 12. Definitions for test circuit: RL = Load resistor CL = Load capacitance including jig and probe capacitance RT = Termination resistance should be equal to the output impedance Zo of the pulse generator Fig 7. Load circuitry for switching times Table 12: Test data Supply voltage Load VEXT VCC CL RL [1] tPLH, tPHL tPZH, tPHZ tPZL, tPLZ 0.8 V to 3.6 V 5 pF, 10 pF, 15 pF and 30 pF 5 k Ω or 1 MΩ open GND 2 × VCC 001aac521 PULSE GENERATOR DUT RT VI VO VEXT VCC RL 5 k Ω CL |
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