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UPD23C16340 Fiches technique(PDF) 9 Page - NEC |
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UPD23C16340 Fiches technique(HTML) 9 Page - NEC |
9 / 20 page 9 µµµµPD23C16340, 23C16380 Data Sheet M15709EJ2V0DS AC Characteristics (TA = –10 to +70 °C, VCC = 2.7 to 3.6 V) Parameter Symbol Test condition VCC = 3.0 V ± 0.3 V VCC = 3.3 V ± 0.3 V Unit MIN. TYP. MAX. MIN. TYP. MAX. Address access time tACC 90 85 ns Page access time tPAC 25 25 ns Address skew time tSKEW Note 10 10 ns Chip enable access time tCE 90 85 ns Output enable access time tOE 25 25 ns Output hold time tOH 00 ns Output disable time tDF 0 25 0 25 ns WORD, /BYTE access time tWB 90 85 ns Note tSKEW indicates the following three types of time depending on the condition. 1) When switching /CE from high level to low level, tSKEW is the time from the /CE low level input point until the next address is determined. 2) When switching /CE from low level to high level, tSKEW is the time from the address change start point to the /CE high level input point. 3) When /CE is fixed to low level, tSKEW is the time from the address change start point until the next address is determined. Since specs are defined for tSKEW only when /CE is active, tSKEW is not subject to limitations when /CE is switched from high level to low level following address determination, or when the address is changed after /CE is switched from low level to high level. Remark tDF is the time from inactivation of Chip Enable input (/CE) or Output Enable input (/OE or OE) to high impedance state output. AC Test Conditions Input waveform (Rise / Fall time ≤≤≤≤ 5 ns) Test points 1.4 V 1.4 V Output waveform Test points 1.4 V 1.4 V Output load 1TTL + 100 pF |
Numéro de pièce similaire - UPD23C16340 |
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Description similaire - UPD23C16340 |
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