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HCPL-314J-300 Fiches technique(PDF) 8 Page - Agilent(Hewlett-Packard)

No de pièce HCPL-314J-300
Description  0.4 Amp Output Current IGBT Gate Drive Optocoupler
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HCPL-314J-300 Fiches technique(HTML) 8 Page - Agilent(Hewlett-Packard)

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Switching Specifications (AC)
Over recommended operating conditions unless otherwise specified.
Test
Parameter
Symbol
Min.
Typ.
Max.
Units
Conditions
Fig.
Note
Propagation Delay Time to
tPLH
0.1
0.2
0.7
µs
Rg = 47
Ω,
10,11,
14
High Output Level
Cg = 3 nF,
12,13,
Propagation Delay Time to
tPHL
0.1
0.3
0.7
µs
f = 10 kHz,
14,17
Low Output Level
Duty Cycle =
Propagation Delay
PDD
-0.5
0.5
µs
50%,
10
Difference Between Any
IF = 8 mA,
Two Parts or Channels
VCC = 30 V
Rise Time
tR
50
ns
Fall Time
tF
50
ns
Output High Level Common
|CMH|
10
30
kV/
µsTA = 25°C,
18
11
Mode Transient Immunity
VCM = 1.5 kV
Output Low Level Common
|CML|
10
30
kV/
µs18
12
Mode Transient Immunity
Package Characteristics
For each channel unless otherwise specified.
Test
Parameter
Symbol
Min.
Typ.
Max.
Units
Conditions
Fig.
Note
Input-Output Momentary
VISO
3750
Vrms
TA=25
°C,
8,9
Withstand Voltage
RH<50% for
Output-Output Momentary
VO-O
1500
Vrms
1 min.
15
Withstand Voltage
Input-Output Resistance
RI-O
1012
VI-O=500 V
9
Input-Output Capacitance
CI-O
1.2
pF
Freq=1 MHz
Notes:
1. Derate linearly above 70
°C free air temperature at a rate of 0.3 mA/°C.
2. Maximum pulse width = 10
µs, maximum duty cycle = 0.2%. This value is intended to allow for component tolerances for designs
with IO peak minimum = 0.4 A. See Application section for additional details on limiting IOL peak.
3. Derate linearly above 85
°C, free air temperature at the rate of 4.0 mW/°C.
4. Input power dissipation does not require derating.
5. Maximum pulse width = 50
µs, maximum duty cycle = 0.5%.
6. In this test, VOH is measured with a DC load current. When driving capacitive load VOH will approach VCC as IOH approaches zero
amps.
7. Maximum pulse width = 1 ms, maximum duty cycle = 20%.
8. In accordance with UL 1577, each HCPL-J314 optocoupler is proof tested by applying an insulation test voltage
≥ 5000 V
rms for
1 second (leakage detection current limit II-O ≤ 5 µA). This test is performed before 100% production test for partial discharge
(method B) shown in the IEC/EN/DIN EN 60747-5-2 Insulation Characteristics Table, if applicable.
9. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together.
10. PDD is the difference between tPHL and tPLH between any two parts or channels under the same test conditions.
11. Common mode transient immunity in the high state is the maximum tolerable |dVcm/dt| of the common mode pulse VCM to
assure that the output will remain in the high state (i.e. Vo > 6.0 V).
12. Common mode transient immunity in a low state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure
that the output will remain in a low state (i.e. Vo < 1.0 V).
13. This load condition approximates the gate load of a 1200 V/25 A IGBT.
14. For each channel. The power supply current increases when operating frequency and Qg of the driven IGBT increases.
15. Device considered a two terminal device: Channel one output side pins shorted together, and channel two output side pins shorted
together.


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