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Moteur de recherche de fiches techniques de composants électroniques |
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Moteur de recherche de fiches techniques de composants électroniques |
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AD5415YRU-REEL Fiches technique(PDF) 9 Page - Analog Devices |
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AD5415YRU-REEL Fiches technique(HTML) 9 Page - Analog Devices |
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9 / 28 page  AD5415 Rev. 0 | Page 9 of 28 TERMINOLOGY Relative Accuracy Relative accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after adjusting for zero scale and full scale, and is normally expressed in LSB or as a percentage of full-scale reading. Differential Nonlinearity Differential nonlinearity is the difference in the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB maximum over the operating temperature range ensures monotonicity. Gain Error Gain error or full-scale error is a measure of the output error between an ideal DAC and the actual device output. For these DACs, ideal maximum output is VREF − 1 LSB. Gain error of the DACs is adjustable to zero with external resistance. Output Leakage Current Output leakage current is current that flows in the DAC ladder switches when they are turned off. For the IOUT1 terminal, it can be measured by loading all 0s to the DAC and measuring the IOUT1 current. Minimum current flows in the IOUT2 line when the DAC is loaded with all 1s. Output Capacitance Capacitance from IOUT1 or IOUT2 to AGND. Output Current Settling Time The amount of time it takes for the output to settle to a speci- fied level for a full-scale input change. For these devices, it is specified with a 100 Ω resistor to ground. Digital-to-Analog Glitch Impulse The amount of charge injected from the digital inputs to the analog output when the inputs change state. This is normally specified as the area of the glitch in either pA-s or nV-s depend- ing upon whether the glitch is measured as a current or voltage signal. Digital Feedthrough When the device is not selected, high frequency logic activity on the device’s digital inputs is capacitively coupled through the device to show up as noise on the IOUT pins and subsequently into the following circuitry. This noise is digital feedthrough. Multiplying Feedthrough Error The error due to capacitive feedthrough from the DAC reference input to the DAC IOUT1 terminal when all 0s are loaded to the DAC. Digital Crosstalk The glitch impulse transferred to the outputs of one DAC in response to a full-scale code change (all 0s to all 1s and vice versa) in the input register of the other DAC. It is expressed in nV-s. Analog Crosstalk The glitch impulse transferred to the output of one DAC due to a change in the output of another DAC. It is measured by loading one of the input registers with a full-scale code change (all 0s to all 1s and vice versa), while keeping LDAC high. Then pulse LDAC low and monitor the output of the DAC whose digital code was not changed. The area of the glitch is expressed in nV-s. Channel-to-Channel Isolation The proportion of input signal from one DAC reference input that appears at the output of the other DAC and is expressed in dB. Harmonic Distortion The DAC is driven by an ac reference. The ratio of the rms sum of the harmonics of the DAC output to the fundamental value is the total harmonic distortion (THD). Usually only the lower- order harmonics are included, such as second to fifth. ( ) 1 2 5 2 4 2 3 2 2 log 20 V V V V V THD + + + = Intermodulation Distortion The DAC is driven by two combined sine wave references of frequencies fa and fb. Distortion products are produced at sum and difference frequencies of mfa ± nfb, where m, n = 0, 1, 2, 3 ... Intermodulation terms are those for which m or n is not equal to zero. The second-order terms include (fa + fb) and (fa − fb) and the third-order terms are (2fa + fb), (2fa − fb), (f + 2fa + 2fb) and (fa − 2fb). IMD is defined as ( ) l fundamenta the of amplitude rms products distortion diff and sum the of sum rms IMD log 20 = Compliance Voltage Range The maximum range of (output) terminal voltage for which the device provides the specified characteristics. |
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